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Kelvin Probe Force Microscopy in Nanoscience and Nanotechnology

  • Chapter
Surface Science Tools for Nanomaterials Characterization

Abstract

Kelvin probe force microscopy (KPFM) is applicable to measure surface potential and work function in a localized nanoscale surface area. In this chapter, we describe the theory and measurement of KPFM and its applications in the characterization of inorganic nanostructure and nanomaterials.

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Authors and Affiliations

  1. Beijing National Laboratory for Molecular Sciences, Key Laboratory for the Physics and Chemistry of Nanodevices, College of Chemistry and Molecular Engineering, Peking University, 100871, Beijing, China

    Da Luo & Yan Li

  2. Nano Surfaces Division, Bruker (Beijing) Scientific Technology Co., Ltd, 11 Zhongguancun South Street, 100081, Beijing, China

    Hao Sun

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  1. Da Luo
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  2. Hao Sun
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  3. Yan Li
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Correspondence to Yan Li .

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  1. Center for Advanced Microstructures and Devices, Baton Rouge, LA, USA

    Challa S. S. R. Kumar

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Luo, D., Sun, H., Li, Y. (2015). Kelvin Probe Force Microscopy in Nanoscience and Nanotechnology. In: Kumar, C.S.S.R. (eds) Surface Science Tools for Nanomaterials Characterization. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-44551-8_4

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