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X-Ray Microscopy

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Abstract

XRM is a versatile and attractive tool, due to the large penetration depth of X-rays in matter, X-rays rich spectral structures and the various contrast mechanisms accessible (absorption, phase contrast, fluorescence) that allow scientific questions in many fields of science to be addressed. This contribution aims to provide an introduction to the physics behind XRM and to describe the current state of the art instrumentation, developments and analytical methodologies. The potential of XRM is illustrated with examples from materials, environment and life science.

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Acknowledgments

DE wishes to greatly acknowledge Robert Acres, Joanna Chwiej, Ivan Kempson, Ivan Kreft, Florian Meirer, Jörg Prietzel, Marjana Regvar, Gerd Schneider and Giuliana Tromba for their enthusiasm, their support providing comments and/or illustrations, and Werner Jark for many discussions about sources and optics. This chapter couldn’t have been written without collaborations with colleagues from many facilities and research institutes.

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  1. Elettra-Sincrotrone Trieste S.C.p.A., Strada Statale 14, km 163.5 in AREA Science Park, 34149, Basovizza, TS, Italy

    Diane Eichert

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  1. Physics Department, University "Roma Tre", Roma, Italy

    Settimio Mobilio

  2. Physics Department, Bologna University, Bologna, Italy

    Federico Boscherini

  3. Physics Department, University "Roma Tre", Roma, Italy

    Carlo Meneghini

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Eichert, D. (2015). X-Ray Microscopy. In: Mobilio, S., Boscherini, F., Meneghini, C. (eds) Synchrotron Radiation. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-55315-8_14

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