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Histogram-Based Techniques for ADC Testing

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Design, Modeling and Testing of Data Converters

Part of the book series: Signals and Communication Technology ((SCT))

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Abstract

Over the past 20 years, researchers both in academia and in industry have carried out a large amount of research on the topic of Data Converter Testing. The motivations are both economical and technical. In fact, both the high percentage of testing costs over total production costs and the large increase in the market demand for both Analog-To-Digital (ADC) and digital-to-analog converters have justified investigations and development of new and more efficient testing methods. On the technical side, the problem of data converter testing is challenging for several reasons, such as the nonlinear behavior of the quantizer inside an ADC and the ever-increasing sampling rate. Test engineers have also been challenged both in modeling the test process and in actual implementation of testing procedures. Both sides of this issue are important: modeling brings about new insights in the solution of practical testing problems and, conversely, experimental results help validate and improve models accuracy and usability.

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Author information

Authors and Affiliations

  1. Department of Electronic and Information Engineering, University of Perugia, Via G. Duranti 93, 06100, Perugia, Italy

    Antonio Moschitta & Paolo Carbone

  2. Department of Industrial Engineering, University of Trento, Via Sommarive 14, 38100, Trento, Italy

    David Macii

  3. Instituto Superior Técnico/Universidade de Lisboa and Instituto de Telecomunicações, Av. Rovisco Pais 1, 1049-001, Lisbon, Portugal

    Francisco Corrêa Alegria

Authors
  1. Antonio Moschitta
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  2. David Macii
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  3. Francisco Corrêa Alegria
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  4. Paolo Carbone
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Corresponding author

Correspondence to Antonio Moschitta .

Editor information

Editors and Affiliations

  1. Information Engineering, University of Perugia Department of Electronic and, Perugia, Italy

    Paolo Carbone

  2. School of Electrical, Computer, and Energy Engineering, Arizona State University, Tempe, Arizona, USA

    Sayfe Kiaei

  3. Polytope Solutions, Newton, USA

    Fang Xu

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Moschitta, A., Macii, D., Alegria, F.C., Carbone, P. (2014). Histogram-Based Techniques for ADC Testing. In: Carbone, P., Kiaei, S., Xu, F. (eds) Design, Modeling and Testing of Data Converters. Signals and Communication Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-39655-7_11

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  • DOI: https://doi.org/10.1007/978-3-642-39655-7_11

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  • Print ISBN: 978-3-642-39654-0

  • Online ISBN: 978-3-642-39655-7

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