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Dynamic Testing of Analog-to-Digital Converters by Means of the Sine-Fitting Algorithms

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Design, Modeling and Testing of Data Converters

Part of the book series: Signals and Communication Technology ((SCT))

Abstract

The chapter is dedicated to dynamic testing of Analog-to-Digital Converters (ADCs) by means of both time- and frequency-domain sine-fitting algorithms (SFAs). At first the sine-fitting procedure used for the estimation of SIgnal-to-Noise And Distortion ratio (SINAD) and Effective Number Of Bits (ENOB) parameters is described. In the following the expressions for the bias and the standard deviation of the ENOB estimator provided by a SFA are derived. Then, the SFAs based on the Interpolated Discrete Fourier Transform (IpDFT) method, the Energy-Based (EB) method, and the well known three- and four-parameter SFAs are separately analyzed. For each algorithm, the basic theoretical background and the operational detail are given. Moreover, the accuracy of all the presented algorithms are compared by means of both theoretical and simulation results. Some aspects concerning the influence of the harmonics, time jitter, and time base distortions on the dynamic performance of an ADC are also discussed. Besides, some Multi-Harmonics Sine-Fitting Algorithms (MHSFAs) are briefly described. Finally, the accuracy of the ENOB estimates provided by the considered SFAs and MHSFAs are compared through real-world data.

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Author information

Authors and Affiliations

  1. Department of Industrial Engineering, University of Trento, Via Sommarive, No. 5, 38100, Trento, Italy

    Dario Petri

  2. Faculty of Electronics and Telecommunications, “Politehnica” University of Timişoara, Bv. V. Pârvan, No. 2, 300223, Timisoara, Romania

    Daniel Belega

  3. IMS Laboratory, University of Bordeaux-IPB ENSEIRB MATMECA 351 Cours de la Libération, Bâtiment A31, 33405, Talence Cedex, France

    Dominique Dallet

Authors
  1. Dario Petri
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  2. Daniel Belega
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  3. Dominique Dallet
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Correspondence to Daniel Belega .

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Editors and Affiliations

  1. Information Engineering, University of Perugia Department of Electronic and, Perugia, Italy

    Paolo Carbone

  2. School of Electrical, Computer, and Energy Engineering, Arizona State University, Tempe, Arizona, USA

    Sayfe Kiaei

  3. Polytope Solutions, Newton, USA

    Fang Xu

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Petri, D., Belega, D., Dallet, D. (2014). Dynamic Testing of Analog-to-Digital Converters by Means of the Sine-Fitting Algorithms. In: Carbone, P., Kiaei, S., Xu, F. (eds) Design, Modeling and Testing of Data Converters. Signals and Communication Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-39655-7_10

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  • DOI: https://doi.org/10.1007/978-3-642-39655-7_10

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