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Advanced Control of Atomic Force Microscope for Faster Image Scanning

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Applied Methods and Techniques for Mechatronic Systems

Part of the book series: Lecture Notes in Control and Information Sciences ((LNCIS,volume 452))

Abstract

In atomic force microscopy (AFM), the dynamics and nonlinearities of its nanopositioning stage are major sources of image distortion, especially when imaging at high scanning speed. This chapter discusses the design and experimental implementation of an observer-based model predictive control (OMPC) scheme which aims to compensate for the effects of creep, hysteresis, cross-coupling, and vibration in piezoactuators in order to improve the nanopositioning of an AFM. The controller design is based on an identified model of the piezoelectric tube scanner (PTS) for which the control scheme achieves significant compensation of its creep, hysteresis, cross-coupling, and vibration effects and ensures better tracking of the reference signal. A Kalman filter is used to obtain full-state information about the plant. The experimental results illustrate the use of this proposed control scheme.

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Acknowledgments

The authors would like to thank Mr. Shane Brandon, SEIT, UNSW, Canberra, Australia for his technical support during the experimental tests.

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Authors and Affiliations

  1. School of Engineering and Information Technology, The University of New South Wales, Canberra, ACT, 2600, Australia

    M. S. Rana, H. R. Pota & I. R. Petersen

Authors
  1. M. S. Rana
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  2. H. R. Pota
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  3. I. R. Petersen
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Corresponding author

Correspondence to M. S. Rana .

Editor information

Editors and Affiliations

  1. Huazhong University of Science and Technology, Wuhan, People's Republic of China

    Lei Liu

  2. University of the West of England, Bristol, United Kingdom

    Quanmin Zhu

  3. Wuhan University of Science and Technology, Wuhan, People's Republic of China

    Lei Cheng

  4. Huazhong University of Science and Technology, Wuhan, People's Republic of China

    Yongji Wang

  5. China University of Petroleum, Qingdao, People's Republic of China

    Dongya Zhao

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© 2014 Springer-Verlag Berlin Heidelberg

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Rana, M.S., Pota, H.R., Petersen, I.R. (2014). Advanced Control of Atomic Force Microscope for Faster Image Scanning. In: Liu, L., Zhu, Q., Cheng, L., Wang, Y., Zhao, D. (eds) Applied Methods and Techniques for Mechatronic Systems. Lecture Notes in Control and Information Sciences, vol 452. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-36385-6_19

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  • DOI: https://doi.org/10.1007/978-3-642-36385-6_19

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-36384-9

  • Online ISBN: 978-3-642-36385-6

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