Abstract
Over the last two decades or so optical methods have become increasingly popular as a means to measure surface topology. Compared to traditional contacting methods, optical instruments such as Coherence Scanning Interferometers (CSI) and Confocal Microscopes (CM) have the capability to collect large, high-resolution data sets without risk of surface damage and consequently are extensively used in research laboratories to calculate areal surface parameters [1]. Despite the significant advantages of optical metrology, however, unexplained errors are frequently observed especially when sloped artefacts are measured and consequently their use as a traceable measurement tool has been brought into question [2].
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Coupland, J. (2014). Linear Theory of Optical Surface Measuring Instruments. In: Osten, W. (eds) Fringe 2013. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-36359-7_8
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DOI: https://doi.org/10.1007/978-3-642-36359-7_8
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