Abstract
The terahertz properties of a Double Drift Region (DDR) heterostructure IMPATT diode, based on GaN/A1GaN, are simulated for operation around 0.5 THz. The device DC to RF conversion efficiency of 17.1% and a noise measure of 21 dB, expected from the heterostructure GaN/A1GaN IMPATT diode, are noteworthy.
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Swain, S.K., Pattanaik, S.R., Pradhan, J., Dash, G.N. (2019). Terahertz Properties of GaN/AlGaN Heterostructure IMPATT Diode. In: Sharma, R., Rawal, D. (eds) The Physics of Semiconductor Devices. IWPSD 2017. Springer Proceedings in Physics, vol 215. Springer, Cham. https://doi.org/10.1007/978-3-319-97604-4_44
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DOI: https://doi.org/10.1007/978-3-319-97604-4_44
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