Abstract
This chapter deals with the basic concepts of scanning probe microscopy, especially atomic and magnetic force microscopy techniques. The basic working principles are discussed along with highlighting the main parts of the instrument. In the experimental part, we have discussed the Co films of thickness ∼4 nm deposited by electron beam evaporation technique on silica ∼5-nm-thick layer deposited on silicon (100) substrate, viz., Co (4 nm)/Silica (5 nm)/Si. The films were irradiated using 120 MeV Ag ions at different ion fluences. We have discussed surface topography and other features before and after irradiation on thin films in terms of domain size, Bloch walls, and uniformity of the magnetic signals obtained from MFM studies. It provides us an idea about the utilization of magnetic force microscopy to study the magnetic properties of the films using MFM. Further, we have put few examples of the images obtained from SPMs in different modes to show the versatility of the instrument. Finally, we have discussed a set of useful statistical functions to characterize the surface features, namely, height fluctuations in irradiated surfaces using AFM images.
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Sulania, I., Yadav, R.P., Karn, R.K. (2018). Atomic and Magnetic Force Studies of Co Thin Films and Nanoparticles: Understanding the Surface Correlation Using Fractal Studies. In: Sharma, S. (eds) Handbook of Materials Characterization. Springer, Cham. https://doi.org/10.1007/978-3-319-92955-2_7
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DOI: https://doi.org/10.1007/978-3-319-92955-2_7
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