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From Micro- to Nano-objects and from Giga- to Terahertz Frequency Range: Quasi-optical Resonant Diagnostics of Objects

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Semiconductor Nanotechnology

Part of the book series: Nanostructure Science and Technology ((NST))

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Abstract

A highly sensitive method of contactless microwave diagnostics is considered that allows to examine the properties of small objects of different shapes and permittivities and small local inhomogeneities of artificial (composite) and natural materials. The method is based on multiple interactions of radio waves with an examined object in an open quasi-optical resonator. It can be used in a wide frequency range, from units of gigahertz to several tens of terahertz, unachievable by other methods.

The capabilities of the method are illustrated by detection of local nanostructured inhomogeneities of super thin threadlike wires under a glass insulation layer, measurement of polarizabilities of small spherical aerogels from carbon nanotubes, technological diagnostics of thin film thickness, and measurement of inhomogeneities of the reflection coefficient of sheet composites.

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Authors and Affiliations

  1. Department of Radioelectronics, Tomsk State University, Tomsk, Russia

    Grigory Dunaevsky & Igor Dorofeev

Authors
  1. Grigory Dunaevsky
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  2. Igor Dorofeev
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Correspondence to Grigory Dunaevsky .

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Editors and Affiliations

  1. Engineering Research Center, Arizona State University, Tempe, Arizona, USA

    Stephen M. Goodnick

  2. Nano and Giga Solutions, Inc, St Paul, Minnesota, USA

    Anatoli Korkin

  3. Physics Department, Arizona State University, Tempe, Arizona, USA

    Robert Nemanich

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Dunaevsky, G., Dorofeev, I. (2018). From Micro- to Nano-objects and from Giga- to Terahertz Frequency Range: Quasi-optical Resonant Diagnostics of Objects. In: Goodnick, S., Korkin, A., Nemanich, R. (eds) Semiconductor Nanotechnology. Nanostructure Science and Technology. Springer, Cham. https://doi.org/10.1007/978-3-319-91896-9_7

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