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Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range

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Optical Characterization of Thin Solid Films

Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 64))

Abstract

The universal dispersion model is a collection of dispersion models (contributions to the dielectric response) describing individual elementary excitation in solids. All contributions presented in this chapter satisfy the basic conditions that follow from the theory of dispersion (time reversal symmetry, Kramers–Kronig consistency and finite sum rule integral). The individual contributions are presented in an unified formalism. In this formalism the spectral distributions of the contributions are parameterized using dispersion functions normalized with respect to the sum rule. These normalized dispersion functions must be multiplied by the transition strengths parameters which can be related to the density of charged particles. The separation of contributions into the transitions strengths and normalized spectral distributions is beneficial since it allows us to elegantly introduce the temperature dependencies into these models.

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Acknowledgements

We are grateful to Dominik Munzar, Adam Dubroka and David Nečas for reading of the manuscript, discussions and useful comments. This research has been supported by the project LO1411 (NPU I) funded by Ministry of Education Youth and Sports of Czech Republic.

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Authors and Affiliations

  1. Faculty of Science, Department of Physical Electronics, Masaryk University, Kotlářská 2, 611 37, Brno, Czechia

    Daniel Franta, Jiří Vohánka & Martin Čermák

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  1. Daniel Franta
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  2. Jiří Vohánka
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  3. Martin Čermák
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Correspondence to Daniel Franta .

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Editors and Affiliations

  1. Abbe School of Photonics, Friedrich-Schiller-University Jena, Jena, Thüringen, Germany

    Olaf Stenzel

  2. Institute of Physical Engineering, Brno University of Technology, Brno, Czech Republic

    Miloslav Ohlídal

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Franta, D., Vohánka, J., Čermák, M. (2018). Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range. In: Stenzel, O., Ohlídal, M. (eds) Optical Characterization of Thin Solid Films. Springer Series in Surface Sciences, vol 64. Springer, Cham. https://doi.org/10.1007/978-3-319-75325-6_3

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