Abstract
In many complex processes, such as semiconductor manufacturing or production of mass storage systems, a large number of variables are monitored simultaneously. These variables can typically be impacted by several points of the manufacturing process, necessitating efforts that include not only monitoring but also diagnostics involving establishing change-points, regimes and potential stages of influence. We discuss statistical methods used to handle such multi-stage data and give examples of applying these methods in large-scale monitoring systems.
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Acknowledgements
I would like to thank Aaron Civil, Reynaldo Corral, Jeff Komatsu, Tony Spielberg, John Wargo and Paul Zulpa from the IBM Supply Chain organization for their kind help, feedback and effort in developing a solution based on this methodology. I am also thankful to David L. Jensen and Brian F. White (IBM Research) for help with software design and development and to Robert J. Baseman for his valuable advice and feedback. My deepest appreciation goes to Steven Ruegsegger and William K. Hoffman from the IBM Microelectronics organization for help in developing software and for integrating the methodology into the ecosystem of tools. I am most thankful to Ishan Sehgal and Jayashree Ravichandran (IBM Internet of Things) for their help and support in productizing this methodology. I am also very indebted to the Editor and the Referee for their insightful comments and suggestions.
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Yashchin, E. (2018). Statistical Monitoring of Multi-Stage Processes. In: Knoth, S., Schmid, W. (eds) Frontiers in Statistical Quality Control 12. Frontiers in Statistical Quality Control. Springer, Cham. https://doi.org/10.1007/978-3-319-75295-2_11
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DOI: https://doi.org/10.1007/978-3-319-75295-2_11
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