Skip to main content
SpringerLink
Log in

Broadband High-Resolution Imaging Spectrometers for the Soft X-Ray Range

  • Conference paper
  • First Online:
X-Ray Lasers 2016 (ICXRL 2016)

Part of the book series: Springer Proceedings in Physics ((SPPHY,volume 202))

Included in the following conference series:

  • 1130 Accesses

Abstract

We develop imaging (stigmatic) XUV spectrometers with the use of plane grazing-incidence varied line-space (VLS) diffraction gratings and focusing normal-incidence multilayer mirrors (MMs), including broadband aperiodic ones. A stigmatic 12–30 nm spectrometer with a resolving power of at least 500 is demonstrated.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Log in via an institution
Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 169.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 219.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 219.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Similar content being viewed by others

References

  1. Cornu, M.A.: Vérifications numériques relatives aux propriétés focales des réseaux diffringents plans. Comptes Rendus Acad. Sci. 117, 1032–1039 (1893)

    Google Scholar 

  2. Hettrick, M.C., Bowyer, S.: Variable line-space gratings: new designs for use in grazing incidence spectrometers. App. Opt. 22, 3921–3924 (1983)

    Article  ADS  Google Scholar 

  3. Pirozhkov, A.S., Ragozin, E.N.: Aperiodic multilayer structures in soft X-ray optics. Phys. Usp. 58, 1095–1105 (2015)

    Article  ADS  Google Scholar 

Download references

Acknowledgements

This work was supported by the Russian Science Foundation (Grant No. 14-12-00506).

Author information

Authors and Affiliations

  1. P. N. Lebedev Physical Institute, Russian Academy of Sciences, 53 Leninskii prospekt, Moscow, 119991, Russia

    A. O. Kolesnikov, E. N. Ragozin, A. N. Shatokhin & E. A. Vishnyakov

  2. Moscow Institute of Physics and Technology (State University), 9 Institutskii per., Dolgoprudnyi, Moscow, 141701, Russia

    A. O. Kolesnikov, A. A. Kuzin, D. V. Negrov, E. N. Ragozin & A. N. Shatokhin

  3. Institute for Spectroscopy Russian Academy of Sciences, 5 Phizicheskaya street, Troitsk, Moscow, 142190, Russia

    A. A. Kuzin

  4. M. V. Keldysh Institute of Applied Mathematics, Russian Academy of Sciences, 4 Miusskaya square, Moscow, 125047, Russia

    P. V. Sasorov

Authors
  1. A. O. Kolesnikov
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. A. A. Kuzin
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. D. V. Negrov
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. E. N. Ragozin
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. P. V. Sasorov
    View author publications

    You can also search for this author in PubMed Google Scholar

  6. A. N. Shatokhin
    View author publications

    You can also search for this author in PubMed Google Scholar

  7. E. A. Vishnyakov
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to E. N. Ragozin .

Editor information

Editors and Affiliations

  1. Kansai Photon Science Institute, National Institutes for Quantum and Radiological Science and Technology, Kyoto, Japan

    Tetsuya Kawachi

  2. Kansai Photon Science Institute, National Institutes for Quantum and Radiological Science and Technology, Kyoto, Japan

    Sergei V. Bulanov

  3. Naraha Remote Technology Development Center, Japan Atomic Energy Agency, Fukushima, Japan

    Hiroyuki Daido

  4. Graduate School for Creation of New Photonics Industries, Shizuoka, Japan

    Yoshiaki Kato

Rights and permissions

Reprints and permissions

Copyright information

© 2018 Springer International Publishing AG

About this paper

Check for updates. Verify currency and authenticity via CrossMark

Cite this paper

Kolesnikov, A.O. et al. (2018). Broadband High-Resolution Imaging Spectrometers for the Soft X-Ray Range. In: Kawachi, T., Bulanov, S., Daido, H., Kato, Y. (eds) X-Ray Lasers 2016. ICXRL 2016. Springer Proceedings in Physics, vol 202. Springer, Cham. https://doi.org/10.1007/978-3-319-73025-7_58

Download citation

Publish with us

Policies and ethics

Search

Navigation