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Phonon Frequencies in Porous Silicon

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Handbook of Porous Silicon

Abstract

An overview of the measurement, nature, and utility of phonon frequencies in porous silicon systems ranging from thin films to nanoparticles is presented. Brillouin and Raman spectroscopy are briefly described, and studies in which these techniques have been successfully applied to phonon frequency measurement in porous silicon are comprehensively listed. The results of studies on the responses of phonon frequencies to different material attributes, chemical treatments, and environmental conditions are summarized. Material properties that have been derived from phonon frequencies are noted.

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  1. Department of Physics and Physical Oceanography, Memorial University of Newfoundland, St. John’s, NL, A1B 3X7, Canada

    G. Todd Andrews

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  1. School of Physics and Astronomy, University of Birmingham, Birmingham, Worcestershire, United Kingdom

    Leigh Canham

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Andrews, G.T. (2018). Phonon Frequencies in Porous Silicon. In: Canham, L. (eds) Handbook of Porous Silicon. Springer, Cham. https://doi.org/10.1007/978-3-319-71381-6_104

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