Abstract
Single-shot time-resolved X-ray scattering capabilities have been developed using X-ray multilayer optics at the beamline NW14A, Photon Factory Advanced Ring, KEK. For investigating structural dynamics of polycrystalline and amorphous materials under shock wave loading, we controlled the X-ray energy bandwidth of ΔE/E = 1–5% from reflected X-ray pulses (ΔE/E = 15%) using X-ray multilayer optics. The high flux and adjustable energy bandwidth of these X-ray pulse provided single-shot X-ray scattering images of irreversible shock compressed polycrystalline and amorphous materials over a nanosecond timescale. Single-shot time-resolved X-ray scattering measurements of shock compressed polycrystalline titanium and bismuth films, and intermediate-range structural changes in fused quartz under shock wave loading are described as typical samples.
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Ichiyanagi, K. et al. (2013). Single-shot time-resolved X-ray scattering measurements of polycrystalline and amorphous materials under shock wave loading. In: Marquis, F. (eds) Proceedings of the 8th Pacific Rim International Congress on Advanced Materials and Processing. Springer, Cham. https://doi.org/10.1007/978-3-319-48764-9_432
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DOI: https://doi.org/10.1007/978-3-319-48764-9_432
Publisher Name: Springer, Cham
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