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Precision Capacitance Readout Electronics for Micro sensors Using Programmable System on Chip

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Intelligent Systems Technologies and Applications 2016 (ISTA 2016)

Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 530))

Abstract

Several techniques are used for measuring the capacitance value with various range, but the need of producing an accurate, less complex and low error system is still a difficulty. In this paper a less complex capacitance measurement system with low stray capacitance and offset error is designed and implemented in Programmable system on chip (PSOC 3) development kit CY8C3866-AXI040. The principle used is linear charging and discharging of capacitor, it generates an oscillation whose frequency is inversely proportional to the capacitance value. The board is interfaced with the laboratory workstation using LabVIEW via serial communication for online data acquisition and monitoring using UART. The embedded readout system developed, measures the capacitance value ranging from nF to pF and the results are discussed. The system measures the capacitance of fabricated capacitive microsensor in its static mode, which is in pF range and it can also measure values of commercially available capacitor.

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Acknowledgment

The above mentioned experiment results are observed in Material Science Group (MSG), Indira Gandhi Center for Atomic Research, Kalpakkam, the author would like to thank Mrs.Usharani Ravi, scientific officer, Electronics and instrumentation section, MSG for her valuable guidance, motivation and encouragement throughout the project work and for supporting by providing valuable suggestion in this paper

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Correspondence to A. Abilash .

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© 2016 Springer International Publishing AG

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Abilash, A., Radha, S. (2016). Precision Capacitance Readout Electronics for Micro sensors Using Programmable System on Chip. In: Corchado Rodriguez, J., Mitra, S., Thampi, S., El-Alfy, ES. (eds) Intelligent Systems Technologies and Applications 2016. ISTA 2016. Advances in Intelligent Systems and Computing, vol 530. Springer, Cham. https://doi.org/10.1007/978-3-319-47952-1_55

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  • DOI: https://doi.org/10.1007/978-3-319-47952-1_55

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-47951-4

  • Online ISBN: 978-3-319-47952-1

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