Abstract
EMCs (Epoxy molding compounds) have been used extensively as an encapsulation and protection material for semiconductor packages. As semiconductor packages trend toward thinner, miniaturized, more function, and higher density, new requirements for EMCs are emerging. This chapter provides an overview of the most recent development on various aspects of EMC technology including advanced material development, molding process, and approaches to address different kinds of advanced packages.
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Hozoji H, Horie O, Ogata S, Numata S, Kinjo T (1990) Jpn J Polym Sci Technol 47:483
The Society of Powder Technology, Japan Ed. (2001) Comminution, classification and surface modification, p. 566, N.G.T
Kusuhara A, Saka M, Ishiguro T (1999) J Adhes Soc Jpn 35:153
Suresh S (2015) Introduction to an alternative substrate for Semicon industry—molded Interconnect Substrate (MIS). Semicon Southeast Asia
Iji M, Kiuchi Y, Katayama I, Uno T (2000) Electron Mater 86
Sakamoto A, Osuga H (2002) Electron Moun Technol 18:44
Bui A, Rudman M (2003) Third internal conference on CFD in the minerals and process industries CSIRO, Melbourne
May TC, Woods MH (1978) Proceedings of the 16th annual international reliability physics symposium, San Diego, pp 33–40
Drozdov M, Kaplan WD, Gur G, Atzmon Z (2008) In-depth Mi-crostructural investigation of copper wire-bonds. In: K & S copper summit conference, pp 1–22
Seri O, Furuya S, Soga N (1989) J Jpn Inst Light Met 39:724
Japan Aluminum Association Standards General Committee (2001) Aluminum handbook. Japan Aluminum Association, Washington, pp 51–54
Seri O (2005) Corrosion and environmental degradation—corrosion of non-ferrous alloys-(2) aluminum-based alloys, materials science and technology, vol 19 of series, Wiley, New York, pp 113–132
Seki H, Chen P, Nakatake H, Zenbutsu S, Itoh S (2010) IEEE CMPT symposium Japan, pp 1–3
Takeda T, Seki H, Itoh S, Zenbutsu S (2011) ECS Trans 34(1):825
Su P, Seki H, Chen P, Zenbutsu S, Itoh S, Huang L, Liao N, Liu B, Chen C, Tai W, Tseng A (2011) IEEE 61st electronic components and technology conference (ECTC), pp 363–369
Su P, Seki H, Nishitani Y, Chen P, Zenbutsu S, Itoh S, Huang L, Liao N, Liu B, Chen C, Tai W, Tseng A (2012) IEEE 62nd electronic components and technology conference (ECTC), pp 1110–1116
Rogers B, Scanlan C, Olson T (2013) Implementation of a fully molded fan-out packaging technology. Deca Technologies, Tempe
Nezu T (2013) Nikkei Electron 1099:53–60
Nezu T (2013) Nikkei Electron 1150:33–45
Abe K (2012) Reality and future prospect of next generation power device and power electronics related apparatus market 2012. Fuji Keizai Co, Tokyo, pp 46–55
Miyairi H, Koike T (2006) Basis & application of structural adhesion. CMC, Tokyo, pp 49–55
http://jp.fujitsu.com/group/labs/techinfo/techguide/list/fingerprint.htm
http://electronics360.globalspec.com/article/4649/apple-samsung-to-drive-fingerprint-sensor-market
(2003) General remarks of epoxy resin, vol 3, advanced I, edited by Association of epoxy resin technology, pp 133–150
http://www.circuitstoday.com/working-of-fingerprint-scanner-2
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Sasajima, H. et al. (2017). New Development Trend of Epoxy Molding Compound for Encapsulating Semiconductor Chips. In: Lu, D., Wong, C. (eds) Materials for Advanced Packaging. Springer, Cham. https://doi.org/10.1007/978-3-319-45098-8_9
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DOI: https://doi.org/10.1007/978-3-319-45098-8_9
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