Abstract
Mono-layer Molybdenum Disulphide (MoS2) crystalline films were obtained on SiO2/Si substrate by mechanical exfoliation. The layer thickness was verified using Raman spectroscopy and Reflectance Contrast spectroscopy. Low temperature (4.5 K) micro-photoluminescence (μ-PL) measurements were performed on the MoS2 samples using a setup we have built which has a spatial resolution of <2 μm. The PL spectra shows two distinct features, one associated with the direct interband transition as the K point of the Brillouin zone of MoS2 and the other most likely associated with a defect. These results are compared with other reports of PL measurements on mono-layer MoS2 crystals.
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Saigal, N., Mukherjee, A., Ghosh, S. (2014). Optical Spectroscopic Studies on Mono-Layer MoS2. In: Jain, V., Verma, A. (eds) Physics of Semiconductor Devices. Environmental Science and Engineering(). Springer, Cham. https://doi.org/10.1007/978-3-319-03002-9_209
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DOI: https://doi.org/10.1007/978-3-319-03002-9_209
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-03001-2
Online ISBN: 978-3-319-03002-9
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