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Particle Detection in Nanomaterial Images Based on Normalized Graph Cuts and Binary Segmentation

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Advances in Automation V (RusAutoCon 2023)

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 1130))

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Abstract

A method for detecting particles in nanomaterial images based on normalized graph sections and binary segmentation is presented in the article. The method includes the following calculations: preliminary segmentation of the image into regions using the simple linear iterative clustering method; segmentation of the obtained regions by the method of normalized cuts on graphs, binary segmentation of the image based on the automatic selection of the threshold by the image histogram. The scientific novelty of the proposed method is the calculation of the threshold for binary segmentation based on a histogram. The binary segmentation threshold is calculated iteratively. The studies were carried out on images of nanomaterials obtained using transmission electron microscopy. The accuracy was used to numerically evaluate the results of the proposed method. The method does not require prior training. Also, the method does not require large computing resources. The practical application of the method consists in further calculation of the particle size on images of nanomaterials for the analysis of structures.

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Acknowledgments

The research was carried out within the state assignment in the field of scientific activity of the Ministry of Science and Higher Education of the Russian Federation (theme FZUN-2020-0013, state assignment of VlSU). The study was carried out using the equipment of the interregional multispecialty and interdisciplinary center for the collective usage of promising and competitive technologies in the areas of development and application in industry/mechanical engineering of domestic achievements in the field of nanotechnology (Agreement No. 075-15-2021-692 of August 5, 2021).

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Authors and Affiliations

  1. Murom Institute (Branch) of Vladimir State University, 23, st. Orlovskaya, Murom, 602264, Russia

    A. A. Zakharov, M. V. Zakharova & A. L. Zhiznyakov

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  1. A. A. Zakharov
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  2. M. V. Zakharova
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  3. A. L. Zhiznyakov
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Correspondence to A. A. Zakharov .

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Editors and Affiliations

  1. Moscow Polytechnic University, Moscow, Russia

    Andrey A. Radionov

  2. Moscow Polytechnic University, Moscow, Russia

    Vadim R. Gasiyarov

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Zakharov, A.A., Zakharova, M.V., Zhiznyakov, A.L. (2024). Particle Detection in Nanomaterial Images Based on Normalized Graph Cuts and Binary Segmentation. In: Radionov, A.A., Gasiyarov, V.R. (eds) Advances in Automation V. RusAutoCon 2023. Lecture Notes in Electrical Engineering, vol 1130. Springer, Cham. https://doi.org/10.1007/978-3-031-51127-1_41

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  • DOI: https://doi.org/10.1007/978-3-031-51127-1_41

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-031-51126-4

  • Online ISBN: 978-3-031-51127-1

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