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Scanning Photodielectric Spectroscopy of CdZnTe Crystals

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Advances in Fabrication and Investigation of Nanomaterials for Industrial Applications

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Abstract

An original method of scanning photodielectric spectroscopy (SPDS), which belongs to photoelectric methods for studying localized states of charge carriers in wide-gap semiconductors, is presented. A distinctive feature of this method is the possibility of measuring not only the energy spectrum of carrier states but also the near-surface electrostatic potential of the crystal. The method is based on high sensitivity measurements of the spectral dependences of the real and imaginary parts effective values of the crystal permittivity in the low-frequency region. The obtained dependencies are presented in the form of diagrams in the complex plane. Modifications of the method are considered. The main results of the SPDS study of cadmium zinc telluride crystals are presented.

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Authors and Affiliations

  1. National Aerospace University Kharkiv Aviation Institute, Kharkiv, Ukraine

    Oleg Chugai, Oleksii Poluboiarov, Serhii Oliinyk & Sergei Sulima

Authors
  1. Oleg Chugai
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  2. Oleksii Poluboiarov
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  3. Serhii Oliinyk
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  4. Sergei Sulima
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Editors and Affiliations

  1. Luxembourg Institute of Science and Technology, Belvaux, Luxembourg

    Sivashankar Krishnamoorthy

  2. Redlen Technologies, Port Moody, BC, Canada

    Krzysztof (Kris) Iniewski

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Chugai, O., Poluboiarov, O., Oliinyk, S., Sulima, S. (2024). Scanning Photodielectric Spectroscopy of CdZnTe Crystals. In: Krishnamoorthy, S., Iniewski, K.(. (eds) Advances in Fabrication and Investigation of Nanomaterials for Industrial Applications . Springer, Cham. https://doi.org/10.1007/978-3-031-42700-8_6

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