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Perovskite Polycrystalline Film for X-Ray Imaging

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Metal-Halide Perovskite Semiconductors

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Abstract

X-ray detectors are widely applied in scenarios such as medical imaging and safety inspection. Perovskite polycrystalline films (PPFs) have vast practical prospects due to the feasibility of large-area production on thin-film transistor (TFT) panels in comparison to their single-crystal counterparts. In this chapter, the current progresses, device figures of merit, and specific topics of TFT-integrated PPF X-ray detectors are reviewed. Firstly, the booming developments of PPF TFT imager are overviewed. Secondly, the figures of merit for perovskite X-ray detectors such as the sensitivity, detection limit, and dark current are discussed. Thirdly, specific topics regarding the film thickness, blocking interfaces, and measurement protocols are addressed. Finally, an outlook of the current challenges pending to be tackled for commercialized applications is provided.

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Acknowledgments

The authors would like to acknowledge financial support from the National Key Research and Development Project (2021YFB3201000), National Natural Science Foundation of China (62101200, 62074066).

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Authors and Affiliations

  1. Hubei Jiufengshan Laboratory, Wuhan, P. R. China

    Hao Hu & Jun Liu

  2. Sargent Joint Research Center, Wuhan National Laboratory for Optoelectronics & School of Optical and Electronic Information & National Engineering Research for Laser Processing, Huazhong University of Science and Technology, Wuhan, P. R. China

    Guangda Niu

Authors
  1. Hao Hu
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  2. Jun Liu
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Correspondence to Guangda Niu .

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Editors and Affiliations

  1. Los Alamos National Laboratory, Los Alamos, NM, USA

    Wanyi Nie

  2. Redlen Technologies, Saanichton, BC, Canada

    Krzysztof (Kris) Iniewski

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Hu, H., Liu, J., Niu, G. (2023). Perovskite Polycrystalline Film for X-Ray Imaging. In: Nie, W., Iniewski, K.(. (eds) Metal-Halide Perovskite Semiconductors. Springer, Cham. https://doi.org/10.1007/978-3-031-26892-2_15

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  • DOI: https://doi.org/10.1007/978-3-031-26892-2_15

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