Abstract
Currently, manufacturing industries have begun to employ Artificial Intelligence (AI) technology to enhance production efficiency, and reduce management costs and other problems encountered in their manufacturing processes, e.g., TFT-LCD manufacturing companies are typical examples. During their manufacturing processes, if a dedicated measurement machine is used, it takes time, also lengthening the production time and increasing the production cost. This study would like to measure the printing accuracy of the PI (Polyimide film) process in the cell segment process of a TFT-LCD panel manufacturing factory in central Taiwan by proposing a object detection architecture called Object Detection Measurement (ODM) system which measures PI Coater accuracy by using a deep learning object detection technology. In the ODM, an AOI (automatic optical inspection) machine is utilized to take photos for PI Coater. After that, Yolo v3, an object Identify algorithm, is used to evaluate accuracy of the PI Coater. When PI Coater’s printing accuracy is abnormal it notifies users to check the parameters of the proposed system. It also builds SPC (statistical process control) control graph for PI Coater accuracy. With the SPC, process engineers can query and monitor whether the accuracy has trended to abnormal.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
TFT LCD Manufacturing Process. https://insightsolutionsglobal.com/tft-lcd-manufacturing-process/
Huang, S.C., Chang, Y.C.: Examine the effect of the Image Preprocessing on Defect Detection of TFT-LCD Panels by Automatic Optical Inspection, Master Thesis, National Chiao Tung University (2017)
Sabnis, R.W.: Color filter technology for liquid crystal displays. Displays 20, 119–129 (1999)
Lai, C.H., Cheng, S.: Improvement on Fat Edge Defects of Polyimide Coating Film in LCD Alignment Process, Master Thesis, National Chiao Tung University (2010)
Hayashi, N., et al.: Development of TFT-LCD TAB modules. In: Proceedings of Japan IEMT Symposium, Sixth IEEE/CHMT International Electronic Manufacturing Technology Symposium, Nara, Japan, pp. 79–82 (1989). https://doi.org/10.1109/IEMTS.1989.76114.
Redmon, J., Divvala, S., Girshick, R., Farhadi, A.: You only look once: unified, real-time object detection, arXiv preprint arXiv:1506.02640 (2015)
Yolo: Object detection based on deep learning (including YoloV3). https://mropengate.blogspot.com/2018/06/yolo-yolov3.html
Girshick, R., Donahue, J., Darrell, T., Malik, J.: Rich feature hierarchies for accurate object detection and semantic segmentation. In: IEEE Conference on Computer Vision and Pattern Recognition, pp. 580–587 (2014)
Girshick, R.: Fast R-CNN. In: The IEEE International Conference on Computer Vision, pp. 1440–1448 (2015)
Ren, S., He, K., Girshick, R., Sun, J.: Faster R-CNN: towards real-time object detection with region proposal networks. IEEE Trans. Pattern Anal. Mach. Intell. 39(6), 1137–1149 (2017)
Redmon, J., Farhadi, A.: YOLO9000: better, faster, stronger. In: The IEEE Conference on Computer Vision and Pattern Recognition, pp. 7263–7271 (2017)
He, K., Zhang, X., Ren, S., Sun, J.: Deep residual learning for image recognition. In: The IEEE Conference on Computer Vision and Pattern Recognition, pp. 770–778 (2016)
Lin, T.Y., Dollar, P., Girshick, R., He, K., Hariharan, B., Belongie, S.: Feature pyramid networks for object detection. In: The IEEE Conference on Computer Vision and Pattern Recognition, pp. 2117–2125 (2017)
Redmon, J.: Darknet: open source neural networks in C. https://pjreddie.com/darknet/
Tzutalin. LabelImg. Git code (2015). https://github.com/tzutalin/labelImg
Braun, G.J., Fairchild, M.D.: Image lightness rescaling using sigmoidal contrast enhancement function. J. Electron. Imaging 8(4), 380–393 (1999)
Chen, S.L., Jhou, J.W.: Automatic optical inspection on mura defect of TFT-LCD. In: Proceedings of the 35th International MATADOR Conference, pp. 233–236 (2007)
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2021 The Author(s), under exclusive license to Springer Nature Switzerland AG
About this paper
Cite this paper
Yeh, TW., Leu, FY. (2021). Using Object Detection Technology to Measure the Accuracy of the TFT-LCD Printing Process by Using Deep Learning. In: Barolli, L., Natwichai, J., Enokido, T. (eds) Advances in Internet, Data and Web Technologies. EIDWT 2021. Lecture Notes on Data Engineering and Communications Technologies, vol 65. Springer, Cham. https://doi.org/10.1007/978-3-030-70639-5_33
Download citation
DOI: https://doi.org/10.1007/978-3-030-70639-5_33
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-030-70638-8
Online ISBN: 978-3-030-70639-5
eBook Packages: Intelligent Technologies and RoboticsIntelligent Technologies and Robotics (R0)