Skip to main content

Enlacement and Interlacement Shape Descriptors

  • Conference paper
  • First Online:
Pattern Recognition and Artificial Intelligence (ICPRAI 2020)

Abstract

We propose a novel approach to characterize complex 2D shapes based on enlacement and interlacement directional spatial relations. This new relational concept allows to assess in a polar space how the concave parts of objects are intertwined following a set of directions. In addition, such a spatial relationship has an interesting behavior considering the common properties in pattern recognition such as translation, rotation, scale and symmetry. A shape descriptor is defined by considering the enlacement of its own shape and the disk area that surrounds it. An experimental study carried out on two datasets of binary shapes highlights the discriminating ability of these new shape descriptors.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 109.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 139.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Jain, A.K., Duin, R.P.W., Mao, J.: Statistical pattern recognition: a review. IEEE Trans. Pattern Anal. Mach. Intell. 22(1), 4–37 (2000)

    Article  Google Scholar 

  2. Smeulders, A.W.M., Worring, M., Santini, S., Gupta, A., Jain, R.C.: Content-based image retrieval at the end of the early years. IEEE Trans. Pattern Anal. Mach. Intell. 22(12), 1349–1380 (2000)

    Article  Google Scholar 

  3. Loncaric, S.: A survey of shape analysis techniques. Pattern Recogn. 31(8), 983–1001 (1998)

    Article  Google Scholar 

  4. Zhang, D., Lu, G.: Review of shape representation and description techniques. Pattern Recogn. 37(1), 1–19 (2004)

    Article  Google Scholar 

  5. Chen, C.H.: Handbook of Pattern Recognition and Computer Vision, 5th edn. World Scientific, New Jersey (2016)

    Book  MATH  Google Scholar 

  6. Kauppinen, H., Seppänen, T., Pietikäinen, M.: An experimental comparison of autoregressive and fourier-based descriptors in 2D shape classification. IEEE Trans. Pattern Anal. Mach. Intell. 17(2), 201–207 (1995)

    Article  Google Scholar 

  7. Persoon, E., Fu, K.S.: Shape discrimination using fourier descriptors. IEEE Trans. Pattern Anal. Mach. Intell. 8(3), 388–397 (1986)

    Article  Google Scholar 

  8. Zhang, D., Lu, G.: Shape-based image retrieval using generic fourier descriptor. Sig. Process. Image Commun. 17(10), 825–848 (2002)

    Article  Google Scholar 

  9. Mokhtarian, F., Abbasi, S.: Shape similarity retrieval under affine transforms. Pattern Recogn. 35(1), 31–41 (2002)

    Article  MATH  Google Scholar 

  10. Urdiales, C., Bandera, A., Hernández, F.S.: Non-parametric planar shape representation based on adaptive curvature functions. Pattern Recogn. 35(1), 43–53 (2002)

    Article  MATH  Google Scholar 

  11. Belongie, S.J., Malik, J., Puzicha, J.: Shape matching and object recognition using shape contexts. IEEE Trans. Pattern Anal. Mach. Intell. 24(4), 509–522 (2002)

    Article  Google Scholar 

  12. Kimia, B.B., Tannenbaum, A.R., Zucker, S.W.: Shapes, shocks, and deformations I: the components of two-dimensional shape and the reaction-diffusion space. Int. J. Comput. Vision 15(3), 189–224 (1995)

    Article  Google Scholar 

  13. Zhu, S.H., Yuille, A.L.: FORMS: a flexible object recognition and modelling system. Int. J. Comput. Vision 20(3), 187–212 (1996)

    Article  Google Scholar 

  14. Siddiqi, K., Shokoufandeh, A., Dickinson, S.J., Zucker, S.W.: Shock graphs and shape matching. Int. J. Comput. Vision 35(1), 13–32 (1999)

    Article  Google Scholar 

  15. Teh, C.H., Chin, R.T.: On image analysis by the methods of moments. IEEE Trans. Pattern Anal. Mach. Intell. 10(4), 496–513 (1988)

    Article  MATH  Google Scholar 

  16. Bailey, R.R., Srinath, M.D.: Orthogonal moment features for use with parametric and non-parametric classifiers. IEEE Trans. Pattern Anal. Mach. Intell. 18(4), 389–399 (1996)

    Article  Google Scholar 

  17. Bin, Y., Jia-Xiong, P.: Invariance analysis of improved zernike moments. J. Opt. A: Pure Appl. Opt. 4(6), 606–614 (2002)

    Article  Google Scholar 

  18. Khotanzad, A., Hong, Y.H.: Invariant image recognition by zernike moments. IEEE Trans. Pattern Anal. Mach. Intell. 12(5), 489–497 (1990)

    Article  Google Scholar 

  19. Ghorbel, F.: A complete invariant description for gray-level images by the harmonic analysis approach. Pattern Recogn. Lett. 15(10), 1043–1051 (1994)

    Article  Google Scholar 

  20. Matsakis, P., Wendling, L.: A new way to represent the relative position between areal objects. IEEE Trans. Pattern Anal. Mach. Intell. 21(7), 634–643 (1999)

    Article  Google Scholar 

  21. Matsakis, P., Naeem, M., Rahbarnia, F.: Introducing the \(\Phi \)-descriptor - a most versatile relative position descriptor. In: ICPRAM, Proceedings, pp. 87–98 (2015)

    Google Scholar 

  22. Delaye, A., Anquetil, E.: Learning of fuzzy spatial relations between handwritten patterns. Int. J. Data Mining Modell. Manage. 6(2), 127–147 (2014)

    Google Scholar 

  23. Bloch, I.: Fuzzy relative position between objects in image processing: a morphological approach. IEEE Trans. Pattern Anal. Mach. Intell. 21(7), 657–664 (1999)

    Article  Google Scholar 

  24. Tabbone, S., Wendling, L.: Binary shape normalization using the radon transform. In: DGCI, Proceedings, pp. 184–193 (2003)

    Google Scholar 

  25. Clément, M., Poulenard, A., Kurtz, C., Wendling, L.: Directional enlacement histograms for the description of complex spatial configurations between objects. IEEE Trans. Pattern Anal. Mach. Intell. 39(12), 2366–2380 (2017)

    Article  Google Scholar 

  26. Clément, M., Coustaty, M., Kurtz, C., Wendling, L.: Local enlacement histograms for historical drop caps style recognition. In: ICDAR, Proceedings, pp. 299–304 (2017)

    Google Scholar 

  27. Clément, M., Kurtz, C., Wendling, L.: Fuzzy directional enlacement landscapes. In: DGCI, Proceedings, pp. 171–182 (2017)

    Google Scholar 

  28. Sharvit, D., Chan, J., Tek, H., Kimia, B.B.: Symmetry-based indexing of image databases. J. Vis. Commun. Image Represent. 9(4), 366–380 (1998)

    Article  Google Scholar 

  29. Bernier, T., Landry, J.A.: A new method for representing and matching shapes of natural objects. Pattern Recogn. 36(8), 1711–1723 (2003)

    Article  Google Scholar 

  30. Yang, S.: Symbol recognition via statistical integration of pixel-level constraint histograms: a new descriptor. IEEE Trans. Pattern Anal. Mach. Intell. 27(2), 278–281 (2005)

    Article  Google Scholar 

  31. Kim, W.Y.: A new region-based shape descriptor. ISO/IEC MPEG99/M5472 (1999)

    Google Scholar 

  32. Tabbone, S., Wendling, L., Salmon, J.P.: A new shape descriptor defined on the radon transform. Comput. Vis. Image Underst. 102(1), 42–51 (2006)

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Michaël Clément .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2020 Springer Nature Switzerland AG

About this paper

Check for updates. Verify currency and authenticity via CrossMark

Cite this paper

Clément, M., Kurtz, C., Wendling, L. (2020). Enlacement and Interlacement Shape Descriptors. In: Lu, Y., Vincent, N., Yuen, P.C., Zheng, WS., Cheriet, F., Suen, C.Y. (eds) Pattern Recognition and Artificial Intelligence. ICPRAI 2020. Lecture Notes in Computer Science(), vol 12068. Springer, Cham. https://doi.org/10.1007/978-3-030-59830-3_45

Download citation

  • DOI: https://doi.org/10.1007/978-3-030-59830-3_45

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-030-59829-7

  • Online ISBN: 978-3-030-59830-3

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics