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High-Utility Interval-Based Sequences

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Big Data Analytics and Knowledge Discovery (DaWaK 2020)

Part of the book series: Lecture Notes in Computer Science ((LNISA,volume 12393))

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Abstract

Sequential pattern mining is an interesting research area with broad range of applications. Most prior research on sequential pattern mining has considered point-based data where events occur instantaneously. However, in many application domains, events persist over intervals of time of varying lengths. Furthermore, traditional frameworks for sequential pattern mining assume all events have the same weight or utility. This simplifying assumption neglects the opportunity to find informative patterns in terms of utilities, such as cost. To address these issues, we incorporate the concept of utility into interval-based sequences and define a framework to mine high utility patterns in interval-based sequences i.e., patterns whose utility meets or exceeds a minimum threshold. In the proposed framework, the utility of events is considered while assuming multiple events can occur coincidentally and persist over varying periods of time. An algorithm named High Utility Interval-based Pattern Miner (HUIPMiner) is proposed and applied to real datasets. To achieve an efficient solution, HUIPMiner is augmented with a pruning strategy. Experimental results show that HUIPMiner is an effective solution to the problem of mining high utility interval-based sequences.

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Acknowledgments

The authors wish to thank Rahim Samei (Technical Manager at ISM Canada) and the anonymous reviewers for the insightful suggestions. This research was supported by funding from ISM Canada and NSERC Canada.

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Correspondence to S. Mohammad Mirbagheri .

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Mirbagheri, S.M., Hamilton, H.J. (2020). High-Utility Interval-Based Sequences. In: Song, M., Song, IY., Kotsis, G., Tjoa, A.M., Khalil, I. (eds) Big Data Analytics and Knowledge Discovery. DaWaK 2020. Lecture Notes in Computer Science(), vol 12393. Springer, Cham. https://doi.org/10.1007/978-3-030-59065-9_9

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  • DOI: https://doi.org/10.1007/978-3-030-59065-9_9

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-030-59064-2

  • Online ISBN: 978-3-030-59065-9

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