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Infrared Image Fault Identification Method Based on YOLO Target Detection Algorithm

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Web, Artificial Intelligence and Network Applications (WAINA 2020)

Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 1150))

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Abstract

With the development of smart grids, the use of UAV to inspect power equipment has become one of the hot technologies. However, the current work of troubleshooting is still mainly based on labor. This method is time consuming and laborious, and the accuracy will be affected. Therefore, this paper proposes an infrared image fault identification method based on YOLO target detection algorithm, which is used to detect the state of the power equipment in real time in the video of the inspection, and identify and locate the fault. First, use image enhancement techniques to reduce signal-to-noise ratio, improve fault recognizability, suppress background and other interference. Then, summarize the distribution characteristics of the fault in the image, and select the appropriate candidate box by the method of dimension clustering. And for the problem of high false detection rate caused by environmental impact, the training data sets of different targets and their sizes in various environments are established, which makes the identification of the target more precise. Finally, the feature is extracted by convolutional neural network. Each layer uses the method of batch normalization to standardize the input data, and trains the YOLO network model that can identify infrared faults in many environments. The experimental results show that the model can effectively detect fault targets of different sizes in various environments. The model can be effectively applied in practice.

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Correspondence to Fangrong Zhou .

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Zhou, F., Ma, Y., Ma, Y., Pan, H. (2020). Infrared Image Fault Identification Method Based on YOLO Target Detection Algorithm. In: Barolli, L., Amato, F., Moscato, F., Enokido, T., Takizawa, M. (eds) Web, Artificial Intelligence and Network Applications. WAINA 2020. Advances in Intelligent Systems and Computing, vol 1150. Springer, Cham. https://doi.org/10.1007/978-3-030-44038-1_42

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