Structural and Optical Properties Study of ZnO Nanocomposites Electrodeposited on Porous Silicon Substrates

Abstract

ZnO films deposited on silicon porous substrates (PS) were prepared by electro-deposition anodization on (100) silicon wafer. This ZnO/PS structure combines substrates having specific structural and optical properties (IR emission), with nano-composites of ZnO potentially interesting due to their functional properties (UV emission) to be integrated as constitutive elements of devices in various optoelectronic applications mainly in blue light emitters. The structural properties characterized by X-ray diffraction (XRD), scanning electronic microscopy (SEM) and the optical properties as the photoluminescence and the reflectance were investigated here by FT-IR spectrometry measurements and had been clearly interpreted. Our ZnO nanocomposites were successfully deposited on PS substrates. These nanostructures were prepared by electrodeposition technique using ZnCl₂ and the KCl under optimized conditions. This technique has some advantages compared to the physical deposition techniques. By this combine the photoluminescence (PL) of ZnO/PS increased and covered the most of the visible spectra. SEM images shows clearly that the ZnO particles entered in the pores of porous silicon despite the fact that few pores of PS were not covered completely by the ZnO particles. In other words, with the high porosity and the low dimension of the PS layer structure may be increase the photoluminescence (PL). With this combined structure, the blue shift in the PL peak is possible and easy to obtain (467 nm). The blue shift in the PL peak is possible and easy to obtain.