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System for Measuring Infrared Radiant Flux with Application of New Methods of Noise Detection and Reduction

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Mechatronics 2019: Recent Advances Towards Industry 4.0 (MECHATRONICS 2019)

Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 1044))

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Abstract

Open optoelectronic connections are used in many modern meters. In numerous applications, a measuring system is to detect changes in optical coupling between elements of the connection. These changes may be triggered by a moving diaphragm, or a changing optical permeability of a factor separating an illuminator from a photodetector. The article presents the original solution based on the subtraction from the photodetector’s measurement signal cyclically stored its noise signal obtained during breaks in the emitter’s work. The developed solutions ensure the possibility of detecting signals comparable to the photoelement noise level – the application in the differential system of one photodetector, illuminated in an intermitted manner, as a source of a measuring signal, as well as noise signal, in practice allows to reduce thermal noises of the photodetector. The system ensures high linearity of conversion.

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References

  1. Alabedra, R.: Noise in Optoelectronic Devices. In: Sikula, J., Levinshtein, M. (eds.) Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices. NATO Science Series II: Mathematics, Physics and Chemistry (II. Mathematics, Physics and Chemistry), vol. 151. Springer, Dordrecht (2004)

    Google Scholar 

  2. Righini, G.C., Tajani, A., Cutolo, A. (eds.): An Introduction to Optoelectronic Sensors. Series in Optics and Photonics, vol. 7. World Scientific Publishing Co. Pte. Ltd., Singapore (2009)

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  3. Pawlaczyk, A.: Elementy i układy optoelektroniczne. WKiŁ, Warszawa (1984). (in Polish)

    Google Scholar 

  4. Leight, W.B.: Devices for Optoelectronic. Marcel Dekker Inc., New York (1996)

    Google Scholar 

  5. Hui, R., O’Sullivan, M.: Fiber Optic Measurement Techniques. Elsevier Science Publishing Co. Inc., Amsterdam (2008)

    Google Scholar 

  6. Wilson, J.S. (ed.): Sensor Technology Handbook. Elsevier, Amsterdam (2005)

    Google Scholar 

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Correspondence to Maciej Bodnicki .

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Bodnicki, M., Sakowicz, P. (2020). System for Measuring Infrared Radiant Flux with Application of New Methods of Noise Detection and Reduction. In: Szewczyk, R., Krejsa, J., Nowicki, M., Ostaszewska-Liżewska, A. (eds) Mechatronics 2019: Recent Advances Towards Industry 4.0. MECHATRONICS 2019. Advances in Intelligent Systems and Computing, vol 1044. Springer, Cham. https://doi.org/10.1007/978-3-030-29993-4_10

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