Abstract
This paper propose a new test pattern generation approach that can generate test patterns with high randomness as well with lowest possible power consumption. This paper also compares the proposed approach with the traditional LFSR structures such as bit swapping LFSR and cellular automata based LFSR. The experimental results prove that the fuzzy logic based random number generation approach is more suitable for testing of highly complex digital circuits.
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Sathesh Kumar, G., Saminadan, V. (2019). A Performance Comparison of Fuzzy Logic Based Truly Random Number Generator with Other Low Power LFSR Architectures. In: Hemanth, J., Fernando, X., Lafata, P., Baig, Z. (eds) International Conference on Intelligent Data Communication Technologies and Internet of Things (ICICI) 2018. ICICI 2018. Lecture Notes on Data Engineering and Communications Technologies, vol 26. Springer, Cham. https://doi.org/10.1007/978-3-030-03146-6_80
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DOI: https://doi.org/10.1007/978-3-030-03146-6_80
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