Abstract
As with any other microscopic technique, in atomic force microscopy (AFM), problems can arise. Some of these happen due to improper use of the microscope by the operator, and some are due to particular characteristics of the sample. Some occur depending on the type of instrument, or from probe damage. Some of them are artifacts inherent in the technique. Knowledge of these issues is important for correct data acquisition and interpretation, and in many cases, training in AFM is inadequate. In this chapter we show examples of common artifacts in AFM and describe, where possible, how to overcome them. Other practical issues important for best practice in AFM operation, such as noise reduction and data processing, are also discussed.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Michael Hollas J (2004) Modern spectroscopy. In: Modern spectroscopy. Wiley, Hoboken, NJ, p 41–71
Goldstein JI, Newbury DE, Michael JR et al (2017) Image defects. In: Scanning electron microscopy and X-ray microanalysis. Springer, New York, pp 133–146
Spence JCH, Spence RPPJCH, DeWitt BS (2003) High-resolution Electron Microscopy, 3rd edn. Oxford University Press, New York, pp 15–47
Nie H-Y, Walzak MJ, Mcintyre NSCN (2002) Use of biaxially oriented polypropylene film for evaluating and cleaning contaminated atomic force microscopy probe tips: an application to blind reconstruction. Rev Sci Instrum 73:3831–3836
Eaton P. SPM. Standards and reference samples. In: AFMHelp.com. http://afmhelp.com/index.php?option=com_content&view=article&id=48&Itemid=54. Accessed 3 May 2018
Ramirez-Aguilar KA, Rowlen KL (1998) Tip characterization from AFM images of nanometric spherical particles. Langmuir 14:2562–2566
Bykov V, Gologanov A, Shevyakov V (1998) Test structure for SPM tip shape deconvolution. Appl Phys A Mater Sci Process 66:499–502
Ho H, West P (1996) Optimizing AC-mode atomic force microscope imaging. Scanning 18:339–343
Nie HY, McIntyre NS (2001) A simple and effective method of evaluating atomic force microscopy tip performance. Langmuir 17:432–436
Sirghi L, Kylián O, Gilliland D et al (2006) Cleaning and hydrophilization of atomic force microscopy silicon probes. J Phys Chem B 110:25975–25981. https://doi.org/10.1021/JP063327G
Lo YS, Huefner ND, Chan WS et al (1999) Organic and inorganic contamination on commercial Afm cantilevers. Langmuir 15:6522–6526
Nie H-Y, McIntyre NS (2007) Unstable amplitude and noisy image induced by tip contamination in dynamic force mode atomic force microscopy. Rev Sci Instrum 78:23701
Chen Y, Cai JY, Liu ML et al (2004) Research on double-probe, double- and triple-tip effects during atomic force microscopy scanning. Scanning 26:155–161
Gruber A, Gspann J, Hoffmann H (1999) Nanostructures produced by cluster beam lithography. Appl Phys A Mater Sci Process 68:197–201
Eaton P, West P (2010) Chapter 2: instrumental aspects of AFM. In: Atomic force microscopy. Oxford University Press, Oxford, pp 9–48
Eaton P, West P (2010) Appendix B: scanner calibration and certification procedures. In: Atomic force microscopy. Oxford University Press, Oxford, pp 192–197
Russ JC (2006) Human vision. In: The image processing handbook, 5th edn. CRC Press, Boca Raton, p 83–134
Klapetek P (2012) 4.4.2 Data levelling and background extraction. In: Quantitative data processing in scanning probe microscopy: SPM applications. William Andrew, Norwich, NY, p 64–67
Eaton P, West P (2010) Atomic force microscopy. Oxford University Press, Oxford
Eaton P, West P (2010) Processing AFM images. In: Atomic force microscopy, 1st edn. Oxford University Press, Oxford, p 104–109
Eaton P, West P (2010) Substrates for AFM. In: Atomic force microscopy. Oxford University Press, Oxford, pp 87–88
Chada N, Sigdel KP, Gari RRS et al (2015) Glass is a viable substrate for precision force microscopy of membrane proteins. Sci Rep 5:12550
Wagner P (1998) Immobilization strategies for biological scanning probe microscopy. FEBS Lett 430:112–115
Haugstad G (2012) Chapter 5: Probing material properties I: phase imaging. In: Atomic force microscopy: understanding basic modes and advanced applications. Wiley, Hoboken, NJ, p 187–257
Sang X, LeBeau JM (2014) Revolving scanning transmission electron microscopy: correcting sample drift distortion without prior knowledge. Ultramicroscopy 138:28–35
Acknowledgments
This work was financially supported by UCIBIO/REQUIMTE via grant UID/MULTI/04378/2013—POCI/01/0145/FERDER/007728 from FCT/MEC through national funds and co-financed by FEDER, under the Partnership Agreement PT2020.
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2019 Springer Science+Business Media, LLC, part of Springer Nature
About this protocol
Cite this protocol
Eaton, P., Batziou, K. (2019). Artifacts and Practical Issues in Atomic Force Microscopy. In: Santos, N., Carvalho, F. (eds) Atomic Force Microscopy. Methods in Molecular Biology, vol 1886. Humana Press, New York, NY. https://doi.org/10.1007/978-1-4939-8894-5_1
Download citation
DOI: https://doi.org/10.1007/978-1-4939-8894-5_1
Published:
Publisher Name: Humana Press, New York, NY
Print ISBN: 978-1-4939-8893-8
Online ISBN: 978-1-4939-8894-5
eBook Packages: Springer Protocols