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Open the Black Box of Information Technology Artifact: Underlying Technological Characteristics Dimension and its Measurement

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Emerging Technologies for Information Systems, Computing, and Management

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 236))

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Abstract

Previous research suggests the great importance of scrutinizing the information technology (IT) artifact itself. Yet, there is still limited attention to meet that goal. In this research, authors employed multiple research methods to investigate the technological characteristics dimensions, mainly including grounded theory method, focus group in-depth interview, content analysis, panel expert judgments and survey method. The results indicate that the complexity, utilitarian, hedonic, communication, flexibility, reliability, integration, accessibility, timeliness, accuracy, completeness, currency, format and stability are the critical and universal technological characteristics dimensions. Corresponding measurement items were also developed and illustrated. The findings have the potential to be applied in future investigations on the technological characteristics of IT artifact.

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Acknowledgments

This research was supported by Humanities and Social Sciences Research Project of the Ministry of Education of China (11YJC630189) and Zhejiang Provincial Natural Science Foundation of China under Grant (LQ12G02009). And this material is based upon work funded by China Postdoctoral Science Foundation Funded Project (2011M500105, 2012T50560) and National Natural Science Foundation of China (70972119). Besides, this research was supported in part by Zhejiang Provincial Philosophy and Social Sciences Project (12JCGL11YB) and Zhejiang Provincial Key Research Base–Decision Science and Innovation Management (RWSKZD02-201206) and the Contemporary Business and Trade Research Center of Zhejiang Gongshang University, which is the Key Research Institute of Social Sciences and Humanities Ministry of Education.

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Correspondence to Yuan Sun .

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Sun, Y., Fan, Z., Xin, J., Xiang, Y., Chou, Hc. (2013). Open the Black Box of Information Technology Artifact: Underlying Technological Characteristics Dimension and its Measurement. In: Wong, W.E., Ma, T. (eds) Emerging Technologies for Information Systems, Computing, and Management. Lecture Notes in Electrical Engineering, vol 236. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-7010-6_17

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  • DOI: https://doi.org/10.1007/978-1-4614-7010-6_17

  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4614-7009-0

  • Online ISBN: 978-1-4614-7010-6

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