Abstract
Molecular dynamics (MD) simulation is used to simulate the plastic deformation of a nanocrystalline model Cu sample with an average grain size of 5 nm containing 27 grains under high strain rate shear loading. Results show that the plastic deformation of nanocrystalline copper can be divided into two parts: grain sliding dominated part, dislocation motion and grain sliding together dominated part. When the shear strain is less than 4%, the macro plastic deformation is the result of relative sliding of grains, grain rotation does not contribute to the overall plasticity, but it plays a supporting role in grain network adjustment. In this part, the deformation process can be described by viscous flow model. When the strain is greater than 4%, a large number of partial dislocations nucleate in grain boundaries and then slip into grains, most of them finally annihilate in corresponding grain boundaries and some deformation twins emerge near triple junctions. Therefore, the plastic deformation is the result of grain sliding, dislocation slipping and twinning. During shear deformation, shear planes involving several grain boundaries which are sub parallel to the loading plane have been observed.
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Acknowledgements
Our thanks are due to Profs. Haifeng Liu, Haifeng Song, Guicun Ma, Hui Zheng, and Drs. Bo Sun, Yanhong Zhao, Shuaichuang Wang, Gongmu Zhang, Hongzhou Song, Qili Zhang, Mingfeng Tian, for helpful comments and discussions. This work was supported by the National Natural Science Foundation of China (Grant No. 11075021) and the Science Foundations of the Laboratory of Computational Physics and China Academy of Engineering Physics (Grant Nos. 2009A0102005 and 2011A0201002).
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© 2013 The Society for Experimental Mechanics, Inc.
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Guo, L., Shuaichuang, W., Guangcai, Z. (2013). Molecular Dynamics Simulation on Plastic Deformation of Nanocrystalline Copper. In: Chalivendra, V., Song, B., Casem, D. (eds) Dynamic Behavior of Materials, Volume 1. Conference Proceedings of the Society for Experimental Mechanics Series. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-4238-7_27
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DOI: https://doi.org/10.1007/978-1-4614-4238-7_27
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