Abstract
This brief chapter provides an overview of nanomechanical cantilever (NMC) systems with their applications in cantilever-based imaging and manipulation platforms such as atomic force microscopy (AFM) and its varieties. Some new concepts in modeling these systems are also introduced along with practical applications in laser-free imaging and nanoscale manipulation and positioning. In an effort to keep this chapter focused, only a brief overview of these topics is presented in this chapter. Finally, the outlook in NMC-based imaging and manipulation is given.
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Jalili, N. (2013). Nanomechanical Cantilever-Based Manipulation for Sensing and Imaging. In: Mavroidis, C., Ferreira, A. (eds) Nanorobotics. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-2119-1_2
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DOI: https://doi.org/10.1007/978-1-4614-2119-1_2
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