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Noncontact Atomic Force Microscopy and Its Related Topics

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Springer Handbook of Nanotechnology

Part of the book series: Springer Handbooks ((SHB))

Abstract

The scanning probe microscopy (SPM) such as the STM and the NC-AFM is the basic technology for the nanotechnology and also for the future bottom-up process. In Sect. 13.1, the principles of AFM such as operating modes and the frequency modulation method of the NC-AFM are fully explained. Then, in Sect. 13.2, applications of NC-AFM to semiconductors that make clear its potentials such as spatial resolution and functions are introduced. Next, in Sect. 13.3, applications of NC-AFM to insulators such as alkali halides, fluorides and transition metal oxides are introduced. At last, in Sect. 13.4, applications of NC-AFM to molecules such as carboxylate (RCOO–) with R = H, CH3, C(CH3)3 and CF3 are introduced. Thus, the NC-AFM can observe atoms and molecules on various kinds of surfaces such as semiconductor, insulator and metal oxide with atomic/molecular resolutions. These sections are essential to understand the status of the art and the future possibility of NC-AFM that is the second generation of atom/molecule technology.

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Abbreviations

AFM:

atomic force microscope/microscopy

AM:

amplitude modulation

CFM:

chemical force microscopy

DAS:

dimer adatom stacking

FM-AFM:

frequency modulation AFM

FM:

frequency modulation

KPFM:

Kelvin probe force microscopy

LFM:

lateral force microscope

NC-AFM:

noncontact atomic force microscopy

SPM:

scanning probe microscopy

STM:

scanning tunneling microscope/microscopy

UHV:

ultrahigh vacuum

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Acknowledgements

Thanks to Tom Albrecht, Alexis Baratoff, Hartmut Bielefeldt, Gerd Binnig, Dominik Brändlin, Peter van Dongen, Urs Dürig, Christoph Gerber, Stefan Hembacher, Markus Herz, Lukas Howald, Christian Laschinger, Ulrich Mair, Jochen Mannhart, Thomas Ottenthal, Calvin Quate, Marco Tortonese, and the BMBF for funding under project no. 13N6918.

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Authors and Affiliations

  1. Department of Electronic Engineering, Osaka University, Yamada-Oka 2-1, 565-0871, Suita-Citiy, Osaka, Japan

    Seizo Morita Prof. Dr.

  2. Lehrstuhl für Experimentalphysik VI, Universität Augsburg, Universitätsstraße 1, 86135, Augsburg, Germany

    Franz J. Giessibl Dr.

  3. Department of Applied Physics, Osaka University, Yamada-Oka 2-1, 565-0871, Suita, Japan

    Yasuhiro Sugawara Prof. Dr.

  4. Japan Science and Technology Corporation, Innovation Plaza, Hokkaido, 060-0819, Sapporo, Japan

    Hirotaka Hosoi Dr.

  5. Nanoelectronics Laboratory, Hokkaido University, Nishi-8, Kita-13, Kita-ku, 060-8628, Sapporo, Japan

    Koichi Mukasa Prof.

  6. Surface Chemistry Laboratory, Kanagawa Academy of Science and Technology, KSP East 404, 3-2-1 Sakado, Takatsu-ku, Kawasaki-shi, 213-0012, Kanagawa, Japan

    Akira Sasahara Dr.

  7. Surface Chemistry Laboratory, Kanagawa Academy of Science and Technology, KSP East 404, 3-2-1 Sakado, Takatsu-ku, Kawasaki-shi, 213-0012, Kanagawa, Japan

    Hiroshi Onishi Dr.

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  1. Seizo Morita Prof. Dr.
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  2. Franz J. Giessibl Dr.
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  3. Yasuhiro Sugawara Prof. Dr.
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  4. Hirotaka Hosoi Dr.
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  5. Koichi Mukasa Prof.
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  6. Akira Sasahara Dr.
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  7. Hiroshi Onishi Dr.
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Editors and Affiliations

  1. Nanotribology Laboratory for Information Storage and MEMS/NEMS, The Ohio State University, 206 W. 18th Avenue, 43210-1107, Columbus, OH, USA

    Bharat Bhushan Prof.

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© 2004 Springer-Verlag Berlin Heidelberg

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Morita, S. et al. (2004). Noncontact Atomic Force Microscopy and Its Related Topics. In: Bhushan, B. (eds) Springer Handbook of Nanotechnology. Springer Handbooks. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-29838-X_13

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  • DOI: https://doi.org/10.1007/3-540-29838-X_13

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-01218-4

  • Online ISBN: 978-3-540-29838-0

  • eBook Packages: Springer Book Archive

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