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Scanning Ion Conductance Microscopy and Atomic Force Microscopy: A Comparison of Strengths and Limitations for Biological Investigations

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Scanning Ion Conductance Microscopy

Part of the book series: Bioanalytical Reviews ((BIOREV,volume 3))

Abstract

Knowledge of physical properties of cells is vital for many research areas in biology and medicine. Atomic force microscopy (AFM) and scanning ion conductance microscopy (SICM) are two techniques to assess the three-dimensional topography and mechanical properties of cells. This chapter introduces the basic working principles and imaging modes of AFM and SICM and then focuses on their similarities and differences. Strengths and limitations in terms of image resolution, imaging speed, and biomechanical applications are discussed. Also, combined applications of SICM and AFM are highlighted. This chapter shows that SICM has emerged as a major addition to the field of biophysics.

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    Hendrik von Eysmondt & Tilman E. Schäffer

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von Eysmondt, H., Schäffer, T.E. (2022). Scanning Ion Conductance Microscopy and Atomic Force Microscopy: A Comparison of Strengths and Limitations for Biological Investigations. In: Schäffer, T.E. (eds) Scanning Ion Conductance Microscopy. Bioanalytical Reviews, vol 3. Springer, Cham. https://doi.org/10.1007/11663_2022_15

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