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Bootstrap confidence intervals of CNpk for exponentiated Fréchet distribution

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Abstract

Confidence intervals for process capability index using bootstrap method (Chen and Pearn, Qual Reliab Eng Int 13(6), 355–360, 1997) are constructed through simulation assuming that the underlying distribution is exponentiated Fréchet distribution (EFD). Parameters are estimated by Maximum likelihood (ML) method. Also obtain the estimated coverage probabilities and average widths of the bootstrap confidence intervals through Monte Carlo simulation. Illustrate the process capability indices for EFD using some numerical examples.

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Authors and Affiliations

  1. Department of Statistics, The University of Dodoma, PO. Box: 259, Dodoma, Tanzania

    Srinivasa Rao Gadde

  2. Department of Statistics, Acharya Nagarjuna University, Guntur, 522 007, India

    K. Rosaiah & Sridhar Babu Mothukuri

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  1. Srinivasa Rao Gadde
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  2. K. Rosaiah
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  3. Sridhar Babu Mothukuri
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Correspondence to Srinivasa Rao Gadde.

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Gadde, S.R., Rosaiah, K. & Mothukuri, S.B. Bootstrap confidence intervals of CNpk for exponentiated Fréchet distribution. Life Cycle Reliab Saf Eng 8, 33–41 (2019). https://doi.org/10.1007/s41872-018-0069-1

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  • DOI: https://doi.org/10.1007/s41872-018-0069-1

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