Skip to main content
Log in

Ultrasonic Lamb wave sensitivity of P(VDF–TrFE) thin films

  • Original Paper
  • Published:
ISSS Journal of Micro and Smart Systems Aims and scope Submit manuscript

Abstract

This paper presents a study of ultrasonic guided wave sensing performance of poly (vinylidene fluoride–trifluoroethylene) P(VDF–TrFE) thin film sensors. P(VDF–TrFE) thin films show sensitivity to ultrasonic Lamb waves modes similar to conventional PZT wafers. We present a novel guided wave technique to estimate the piezoelectric coefficient e31 of a bonded thin film in situ over ultrasonic frequency band. The technique is very simple that involves the use of the response of thin film and a guided wave propagation model to determine the piezoelectric coefficient at room temperature of 24 °C. The P(VDF–TrFE) thin films show an average e31 values of around 0.0906 C/m2 at various frequencies (60–400 kHz). At various strain levels (0.01–0.02 με) these films show a constant e31 of 0.0972 C/m2. The proposed technique is capable of characterizing the thin film sensors in a non-destructive way and in situ, which helps in their calibration procedure. The study also provides an important insight towards optimized frequency range and sensitivity of newly developed P(VDF–TrFE) thin film for ultrasonic applications.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Fig. 1
Fig. 2
Fig. 3
Fig. 4
Fig. 5
Fig. 6

Similar content being viewed by others

References

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to D. Roy Mahapatra.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Rathod, V.T., Swamy, J.K., Jain, A. et al. Ultrasonic Lamb wave sensitivity of P(VDF–TrFE) thin films. ISSS J Micro Smart Syst 7, 35–43 (2018). https://doi.org/10.1007/s41683-018-0021-7

Download citation

  • Received:

  • Revised:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s41683-018-0021-7

Keywords

Navigation