Accelerated life tests (ALT) are efficient industrial experiments for obtaining measures of a device reliability under the usual working conditions.
A practical problem for industries of different areas is to obtain measures of a device reliability under its usual working conditions. Typically, the time and cost of such experimentation are long and expensive. The ALT are efficient for handling such situation, since the information on the device performance under the usual working conditions are obtained by considering a time and cost-reduced experimental scheme. The ALT are performed by testing items at higher stress covariate levels than the usual working conditions, such as temperature, pressure and voltage.
There is a large literature on ALT and interested readers can refer to Mann et al. (1974), Nelson (1990), Meeker and Escobar (1998) which are excellent sources for ALT. Nelson (2005a, b) provides a brief background on accelerated testing and test plans and surveys the related...
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Bai DS, Cha MS, Chung SW (1992) Optimum simple ramp tests for the Weibull distribution and type-I censoring. IEEE T Reliab 41:407–413
Cox DR, Hinkley DV (1974) Theoretical statistics. Chapman and Hall, London
Davison AC, Hinkley DV (1997) Bootstrap methods and their application. Cambridge University Press, Cambridge
Khamis IH (1997) Comparison between constant- and step-stress tests for Weibull models. Int J Qual Reliab Manag 14:74–81
Lawless JF (2003) Statistical models and methods for lifetime data, 2nd end. Wiley, New York
Louzada-Neto F, Pardo-Fernandéz JC (2001) The effect of reparametrization on the accuracy of inferences for accelerated lifetime tests. J Appl Stat 28:703–711
Mann NR, Schaffer RE, Singpurwalla ND (1974) Methods for statistical analysis of reliability and life test data. Wiley, New York
Meeker WQ, Escobar LA (1998) Statistical methods for reliability data. Wiley, New York
Meeker WQ, Escobar LA (2002) SPLIDA (S-PLUS Life Data Analysis) software–graphical user interface. http://www.public.iastate.edu/splida
Miller R, Nelson WB (1983) Optimum simple step-stress plans for accelerated life testing. IEEE T Reliab 32:59–65
Nelson W (1990) Accelerated testing – statistical models, test plans, and data analyses. Wiley, New York
Nelson W (2005a) A bibliography of accelerated test plans. IEEE T Reliab 54:194–197
Nelson W (2005b) A bibliography of accelerated test plans part II – references. IEEE T Reliab 54:370–373
Perdoná GSC, Louzada Neto F, Tojeiro CAV (2004) Bayesian modelling of log-non-linear stress-response relationships in accelerated lifetime tests. J Stat Theory Appl 3(1):5–12
Reliasoft Corporation (2004) Optimum allocations of stress levels and test units in accelerated tests. Reliab EDGE 5:10–17. http://www.reliasoft.com
Srivastava PW, Shukla R (2008) A log-logistic step-stress model. IEEE T Reliab 57:431–434
Tojeiro CAV, Louzada Neto F, Bolfarine H (2004) A Bayesian analysis for accelerated lifetime tests under an exponential power law model with threshold stress. J Appl Stat 31(6):685–691
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Louzada-Neto, F. (2011). Accelerated Lifetime Testing. In: Lovric, M. (eds) International Encyclopedia of Statistical Science. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-04898-2_103
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