Skip to main content

Software

  • Reference work entry
  • First Online:
Book cover Robust Electronic Design Reference Book

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 649.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Books

  • Designing for Immunity to Pulsed EMI. Wilmington, MA: KeyTek, 1990, pp. 77–81.

    Google Scholar 

  • Handbook of EC EMC Compliance. Boxborough, MA: Compliance Design, 1993, pp. 57, 58.

    Google Scholar 

  • Handbook of EU EMC Compliance. Boxborough, MA: Compliance Design, 1995, pp. 56, 57.

    Google Scholar 

  • Handbook of EU EMC Compliance. Boxborough, MA: Compliance Design, 1996, pp. 62.

    Google Scholar 

  • Arsenault, J. E., and Roberts, J. A., Reliability & Maintainability of Electronic Systems. Computer Science Press, 1980, pp. 424–433.

    Google Scholar 

  • Boxleitner, Warren. Electrostatic Discharge and Electronic Equipment. New York: IEEE Press, 1989, pp. 15–19.

    Google Scholar 

  • Bull, J. H., Guide to Achieving Immunity from Electrical Interference. Leatherhead, Surrey, England: ERA Technology, 1986, pp. 47, 48.

    Google Scholar 

  • Ganssle, Jack G., The Art of Programming Embedded Systems. New York: Academic Press, 1992, pp. 34, 35, 64, 86–100.

    Google Scholar 

  • Goedblood, Jasper, Electromagnetic Compatibility. New York: Prentice Hall, 1990, pp. 288–290.

    Google Scholar 

  • Greason, William D., Electrostatic Damage in Electronics: Devices and Systems. New York: John Wiley & Sons, 1987, pp. 179–182.

    Google Scholar 

  • Greason, William D., Electrostatic Discharge in Electronics. New York: John Wiley & Sons, 1992, pp. 144, 145.

    Google Scholar 

  • Kimmel, William D., and Gerke, Daryl D., Electromagnetic Compatibility in Medical Equipment. New York: IEEE Press, 1995, pp. 99, 100.

    Google Scholar 

  • Lee, P. A., and Anderson, T., Fault Tolerance–Principles and Practices 2nd edition. New York: Springer-Verlag, 1981, pp. 95–121, 143–187.

    Google Scholar 

  • Leveson, Nancy G., Safeware: System Safety and Computers. Boston, MA: Addison-Wesley, 1995, pp. 433–446.

    Google Scholar 

  • Mardiguian, Michel, Controlling Radiated Emissions by Design, 2nd Edition. Boston, MA: Kluwer Academic Publishers, 2001, pp. 83.

    Book  Google Scholar 

  • Mardiguian, Michel, Electrostatic Discharge: Understand, Simulate and Fix ESDProblems. Gainesville, VA: Interference Control Technologies, 1986, pp. 5.10–5.12.

    Google Scholar 

  • O'Hara, Martin, EMC at Component and PCB Level. Boston, MA: Newnes, 1998, pp. 161–170.

    Book  Google Scholar 

  • Ott, Henry W., Noise Reduction Techniques in Electronic Systems, 2nd Edition. New York: John Wiley & Sons, 1988, pp. 344–348.

    Google Scholar 

  • Paul, Clayton R., Introduction to Electromagnetic Compatibility. New York: John Wiley & Sons, 1992, pp. 687.

    Google Scholar 

  • Perez, Reinaldo, Handbook of Electromagnetic Compatibility. New York: Academic Press, 1995, pp. 824.

    Google Scholar 

  • Schmidt, Michael, Implementing the IEEE Software Engineering Standards. Indianapolis, IN: SAMS, 2000, pp. 6, 7, 160–169.

    Google Scholar 

  • Stephans, Richard A., and Talso, Warner, System Safety Analysis Handbook, 2nd Edition. Albuquerque, NM: System Safety Society, July 1997, pp. 6-15–6-19.

    Google Scholar 

  • Williams, Tim, EMC for Product Designers. 2nd Edition. Oxford, UK: 1996, pp. 194–197.

    Google Scholar 

Papers and Articles

  • “Designing with Microcontrollers in Noisy Environments,” ST Application Note AN435, 1998. download from http: //appnote.stts.edu/thompson/2488_OnlinePDF.pdf

    Google Scholar 

  • “Using Software Design Techniques to Maximize Z8(R) MCU System Noise Immunity,” Zilog Application Note AP96Z8X0100, 1997. download from http: //www.zilog.com/pdfs/z8otp/z8_app_OnlinePDF.pdf

    Google Scholar 

  • “Using Software Techniques to Maximize Z8 MCU System Noise Immunity,” Zilog Application Note AN003701-Z8X0400, 2000. download from http: //www.zilog.com/pdfs/z8otp/an_noise_imm_OnlinePDF.pdf

    Google Scholar 

  • Banyai, Chris, and Gerke, Daryl, “EMI Design Techniques for Microcontrollers in Automotive Applications,” Intel Application Note AP-711, Feb. 1996. download from http: //support.intel.co.jp/design/auto/mcs96/applnots/272673.htm

    Google Scholar 

  • Barnes, John R., “Design Hooks to Enhance Card Testing,” (unpublished). November 18, 1991.

    Google Scholar 

  • Barnes, John R., “Designing Electronic Equipment for ESD Immunity Part II,” Printed Circuit Design website, November 2001. download from http: //www.dbicorporation.com/esd-art2.htm

    Google Scholar 

  • Barnes, John R., “Designing Electronic Systems for ESD Immunity,” Conformity, vol. 8 no. 1, pp. 18–27, February 2003. download from http: //www.conformity.com/0302designing_OnlinePDF.pdf

    Google Scholar 

  • Black, J. P., Taylor, D. J., and Morgan, D. E., “A Compendium of Robust Data Structures,” The Eleventh Annual International Symposium on Fault-Tolerant Computing, Portland, MN, June 24–26, 1981, pp. 129–131.

    Google Scholar 

  • Black, J. P., Taylor, D. J., and Morgan, D. E., “An Introduction to Robust Data Structures,” 10th Annual International Symposium on Fault-Tolerant Computing, Kyoto, Japan, Oct. 1–3, 1980, pp. 110–112.

    Google Scholar 

  • Campbell, Dugald, “Designing for Electromagnetic Compatibility with Single-Chip Microcontrollers,” Motorola Semiconductor Application Note AN1263, 1995. download from http: //mot-sps.com/mcu/documentation/pdf/an1263_OnlinePDF.pdf

    Google Scholar 

  • Chesworth, E. Thomas, “EMI-Hardened Microprocessor System Hardware and Software,” EMC EXPO 88 Symposium Record, Washington, D.C., May 10–12, 1988, pp. T35.9–T35.11.

    Google Scholar 

  • Chesworth, E. Thomas, “EMI-Hardened Microprocessors and Software,” Electromagnetic News Report, vol. 25 no. 2, pp. 18–20, Mar./Apr. 1997.

    Google Scholar 

  • Daszczuk, Wiktor B., “Invariant testing techniques for debugging a structured operating system,” Microprocessors and Microsystems, vol. 11 no. 4, pp. 205–208, May 1987.

    Article  Google Scholar 

  • Gerke, Daryl, and Kimmel, Bill, “The Designer's Guide to Electromagnetic Compatibility,” EDN, vol. 39 no. 2, pp. S3–S114, January 20, 1994.

    Google Scholar 

  • Halse, R. G., and Preece, C., “Erroneous execution and recovery in microprocessor systems,” Software and Microsystems, vol. 4 no. 3, June 1985, pp. 63–70.

    Article  Google Scholar 

  • Jarrett, Dick, “Software fault tolerance staves off the errors that besiege uP systems,” Electronic Design, vol. 32 no. 16, pp. 187–202, Aug. 9, 1984.

    Google Scholar 

  • Krause, Bill, “Use Processor Redundancy for Maximum Reliability,” Communication Systems Design, vol. 8 no. 2, pp. 28–34, February 2002.

    Google Scholar 

  • Milward, John, “Safety-related design in microprocessor-based automotive applications,” Microprocessors and Microsystems, vol. 14 no. 5, pp. 318–323, June 1990.

    Article  Google Scholar 

  • Murphy, Niall, “Watchdog Timers,” Embedded Systems Programming, vol. 13 no. 12, pp. 112–124, Nov. 2000.

    Google Scholar 

  • Ong, R. H. L., Pont, M. J., and Peasgood, W., “A comparison of software-based techniques intended to increase the reliability of embedded applications in the presence of EMI,” Microprocessors and Microsystems, vol. 24, pp. 481–491, 2001.

    Article  Google Scholar 

  • Randell, Brian, “System Structure for Software Fault Tolerance,” IEEE Transactions on Software Engineering, vol. SE-1 no. 2, pp. 220–232, June 1975.

    Article  MathSciNet  Google Scholar 

  • Rao, K. N., “Fail-Safe Microcomputer Software,” SAE Transactions, 810159, section 1 vol. 90, pp. 661–666, 1981.

    Google Scholar 

  • Taylor, David J., “Error Models for Robust Storage Structures,” 20th International Symposium on Fault-Tolerant Computing, Chapel Hill, NC, June 26–28, 1990, pp. 416–422.

    Google Scholar 

  • Taylor, David J., and Black, James P., “Guidelines for Storage Structure Error Correction,” The Fifteenth Annual International Symposium on Fault-Tolerant Computing, Ann Arbor, MI, June 19–21, 1985, pp. 20–22.

    Google Scholar 

  • Taylor, David J., and Black, James P., “Principles of Data Structure Error Correction,” IEEE Transactions on Computers, vol. 31 no. 7, pp. 602–608, July 1982.

    Article  Google Scholar 

  • Taylor, David J., Morgan, David E., and Black, James P., “Redundancy in Data Structures: Improving Software Fault Tolerance,” IEEE Transactions on Software Engineering, vol. SE-6 no. 6, pp. 585–594, Nov. 1980.

    Article  MathSciNet  Google Scholar 

  • Taylor, David J., Morgan, David E., and Black, James P., “Redundancy in Data Structures: Some Theoretical Results,” IEEE Transactions on Software Engineering, vol. SE-6 no. 6, pp. 595–602, Nov. 1980.

    Article  MathSciNet  Google Scholar 

  • Taylor, David J., and Seger, Carl-Johan H., “Robust Storage Structures for Crash Recovery,” IEEE Transactions on Computers, vol. C-35 no. 4, pp. 288–295, Apr. 1986.

    Article  Google Scholar 

  • Williams, Kimball, “Microprocessor Software for EMI Recovery,” 1987 IEEE International Symposium on Electromagnetic Compatibility Symposium Record, Atlanta, GA, Aug. 25–27, 1987, pp. 297–301.

    Google Scholar 

  • Williamson, Tom, “Designing Microcontroller Systems for Electrically Noisy Environments,” Intel Application Note AP-125, December 1993, pp. 4.

    Google Scholar 

  • Yoshihara, Katando, Koga, Yoshiaki, and Ishihara, Toyohiko, “A Robust Data Structure Scheme with Checking Loops,” 13th Annual International Symposium on Fault-Tolerant Computing, Milano, Italy, June 28–30, 1983. pp. 241–248.

    Google Scholar 

Download references

Authors

Editor information

John R. Barnes

Rights and permissions

Reprints and permissions

Copyright information

© 2004 Kluwer Academic Publishers

About this entry

Cite this entry

Barnes, J.R. (2004). Software. In: Barnes, J.R. (eds) Robust Electronic Design Reference Book. Springer, New York, NY. https://doi.org/10.1007/1-4020-7830-7_37

Download citation

  • DOI: https://doi.org/10.1007/1-4020-7830-7_37

  • Published:

  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4020-7739-5

  • Online ISBN: 978-1-4020-7830-9

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics