Skip to main content

Visual Quality Assessment by Machine Learning

  • Book
  • © 2015

Overview

  • Presents the emerging techniques of learning based visual quality assessment
  • Highlights machine learning techniques and their applications in visual quality assessment
  • Includes a number of real-world examples that readers can implement in their own work
  • Includes supplementary material: sn.pub/extras

Part of the book series: SpringerBriefs in Electrical and Computer Engineering (BRIEFSELECTRIC)

Part of the book sub series: SpringerBriefs in Signal Processing (BRIEFSSIGNAL)

This is a preview of subscription content, log in via an institution to check access.

Access this book

eBook USD 39.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access

Licence this eBook for your library

Institutional subscriptions

Table of contents (6 chapters)

Keywords

About this book

The book encompasses the state-of-the-art visual quality assessment (VQA) and learning based visual quality assessment (LB-VQA) by providing a comprehensive overview of the existing relevant methods. It delivers the readers the basic knowledge, systematic overview and new development of VQA. It also encompasses the preliminary knowledge of Machine Learning (ML) to VQA tasks and newly developed ML techniques for the purpose. Hence, firstly, it is particularly helpful to the beginner-readers (including research students) to enter into VQA field in general and LB-VQA one in particular. Secondly, new development in VQA and LB-VQA particularly are detailed in this book, which will give peer researchers and engineers new insights in VQA.

Authors and Affiliations

  • National Astronomical Observatories, Chinese Academy of Sciences, Beijing, China

    Long Xu

  • Nanyang Technological University, Singapore, Singapore

    Weisi Lin

  • University of Southern California, Los Angeles, USA

    C.-C. Jay Kuo

Bibliographic Information

Publish with us