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Noncontact Atomic Force Microscopy

Volume 2

  • Book
  • © 2009

Overview

Editors:
  1. Seizo Morita

    1. Graduate School of Engineering, Dept. of Electrical, Electronic and, Osaka University, Suita, Japan

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  2. Franz J. Giessibl

    1. Institut für Experimentelle und, Angewandte Physik, Universität Regensburg, Regensburg, Germany

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    You can also search for this editor in PubMed   Google Scholar

  3. Roland Wiesendanger

    1. FB Physik, Inst. Angewandte Physik, Universität Hamburg, Hamburg, Germany

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  • Most advanced state-of-the-art report on scanning probe microscopy
  • Presents the latest developments in STM and AFM
  • Deals with the various classes of materials studied
  • A valuable reference work for researchers as well as a study text for graduate students

Part of the book series: NanoScience and Technology (NANO)

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Table of contents (18 chapters)

  1. Front Matter

    Pages 1-17
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  2. Introduction

    • Seizo Morita
    Pages 1-13

  3. Method for Precise Force Measurements

    • Masayuki Abe, Ken-ichi Morita
    Pages 15-30

  4. Force Spectroscopy on Semiconductor Surfaces

    • Oscar Custance, Noriaki Oyabu, Yoshiaki Sugimoto
    Pages 31-68

  5. Tip–Sample Interactions as a Function of Distance on Insulating Surfaces

    • Regina Hoffmann
    Pages 69-94

  6. Force Field Spectroscopy in Three Dimensions

    • André Schirmeisen, Hendrik Hölscher, Udo D. Schwarz
    Pages 95-119

  7. Principles and Applications of the qPlus Sensor

    • Franz J. Giessibl
    Pages 121-142

  8. Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond

    • M. Heyde, G. H. Simon, T. König
    Pages 143-167

  9. Atom Manipulation on Semiconductor Surfaces

    • Yoshiaki Sugimoto
    Pages 169-190

  10. Atomic Manipulation on Metal Surfaces

    • Markus Ternes, Christopher P. Lutz, Andreas J. Heinrich
    Pages 191-215

  11. Atomic Manipulation on an Insulator Surface

    • Sabine Hirth, Frank Ostendorf, Michael Reichling
    Pages 217-226

  12. Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM

    • Pablo Pou, Pavel Jelínek, Rubén Pérez
    Pages 227-249

  13. Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces

    • T. Trevethan, N. Martsinovich, L. Kantorovich, A. L. Shluger
    Pages 251-273

  14. Magnetic Exchange Force Microscopy

    • Alexander Schwarz, Uwe Kaiser, Rene Schmidt, Roland Wiesendanger
    Pages 275-286

  15. First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001)

    • Cesar Lazo, Hendrik Hölscher, Vasile Caciuc, Stefan Heinze
    Pages 287-301

  16. Frequency Modulation Atomic Force Microscopy in Liquids

    • Kei Kobayashi, Hirofumi Yamada
    Pages 303-328

  17. Biological Applications of FM-AFM in Liquid Environment

    • Takeshi Fukuma, Suzanne P. Jarvis
    Pages 329-345

  18. High-Frequency Low Amplitude Atomic Force Microscopy

    • Hideki Kawakatsu, Shuhei Nishida, Dai Kobayashi, Kazuhisa Nakagawa, Shigeki Kawai
    Pages 347-360

  19. Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy

    • A. Raman, R. Reifenberger, J. Melcher, R. Tung
    Pages 361-395

  20. Back Matter

    Pages 1-5
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Keywords

About this book

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

Editors and Affiliations

  • Graduate School of Engineering, Dept. of Electrical, Electronic and, Osaka University, Suita, Japan

    Seizo Morita

  • Institut für Experimentelle und, Angewandte Physik, Universität Regensburg, Regensburg, Germany

    Franz J. Giessibl

  • FB Physik, Inst. Angewandte Physik, Universität Hamburg, Hamburg, Germany

    Roland Wiesendanger

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