Editors:
- Includes a treatment of memory design from the perspective of statistical analysis
- Covers relevant theoretical background from other fields: statistics, machine learning, optimization, reliability
- Explains the problem of estimating statistics of memory performance variation
- Shows solutions recently proposed in the Electronic Design Automation (EDA) community
- Contains chapters contributed from both industry and academia
- Includes supplementary material: sn.pub/extras
Part of the book series: Integrated Circuits and Systems (ICIR)
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Table of contents (8 chapters)
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Front Matter
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Back Matter
About this book
Editors and Affiliations
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T.J. Watson Research Center, IBM Corporation, Yorktown Heights, USA
Amith Singhee
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Department of Computer Science, University of Illinois at Urbana-Champai, Urbana, USA
Rob A. Rutenbar
Bibliographic Information
Book Title: Extreme Statistics in Nanoscale Memory Design
Editors: Amith Singhee, Rob A. Rutenbar
Series Title: Integrated Circuits and Systems
DOI: https://doi.org/10.1007/978-1-4419-6606-3
Publisher: Springer New York, NY
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer Science+Business Media, LLC 2010
Hardcover ISBN: 978-1-4419-6605-6Published: 17 September 2010
Softcover ISBN: 978-1-4614-2672-1Published: 05 November 2012
eBook ISBN: 978-1-4419-6606-3Published: 09 September 2010
Series ISSN: 1558-9412
Series E-ISSN: 1558-9420
Edition Number: 1
Number of Pages: X, 246
Topics: Circuits and Systems, Electronics and Microelectronics, Instrumentation