1. Modern Developments and Applications in Microbeam Analysis. Proceedings of the 9^th Workshop of the European Microbeam Analysis Society (EMAS) and the 3^rd Meeting of the International Union of Microbeam Analysis Societies (IUMAS), Florence, Italy, May 22–26, 2005

   • Romano Rinaldi
   • Aldo Armigliato
   • Raynald Gauvin

   Editorial Pages: 1 - 3

2. Imaging Single Atoms with Z-Contrast Scanning Transmission Electron Microscopy in Two and Three Dimensions

   • Paul M. Voyles

   Original Paper 22 May 2006 Pages: 5 - 10

3. Atomic Level Characterization Based on Focus Modulation Electron Microscopy

   • Yoshizo Takai
   • Masaki Taya
   • Yoshihide Kimura

   Original Paper 15 May 2006 Pages: 11 - 17

4. Orientation Imaging Microscopy for the Transmission Electron Microscope

   • David J. Dingley

   Original Paper 06 June 2006 Pages: 19 - 29

5. Advances in Electron Backscatter Diffraction for the Characterisation of Interfaces

   • Valerie Randle

   Original Paper 30 March 2006 Pages: 31 - 37

6. Imaging and Microanalysis in Environmental Scanning Electron Microscopy

   • Bradley L. Thiel

   Original Paper 18 April 2006 Pages: 39 - 44

7. ESEM Applications: From Cultural Heritage Conservation to Nano-Behaviour

   • Eric Doehne

   Original Paper 17 July 2006 Pages: 45 - 50

8. Cathodoluminescence Microscopy and Spectroscopy of Opto-Electronic Materials

   • Matthew R. Phillips

   Original Paper 04 May 2006 Pages: 51 - 58

9. Quantitative Bulk and Trace Element X-Ray Mapping Using Multiple Detectors

   • Ken Moran
   • Richard Wuhrer

   Original Paper 18 April 2006 Pages: 59 - 66

10. Monte Carlo Simulation in Electron Probe Microanalysis. Comparison of Different Simulation Algorithms

    • Francesc Salvat
    • Xavier Llovet
    • Josep Sempau

    Original Paper 04 May 2006 Pages: 67 - 74

11. Quantitative X-Ray Microanalysis of Heterogeneous Materials Using Monte Carlo Simulations

    • Raynald Gauvin

    Original Paper 04 May 2006 Pages: 75 - 81

12. Electron Excited L X-Ray Spectra of the Elements 14 ≤ Z ≤ 22

    • Andrea Aßmann
    • Jan Dellith
    • Michael Wendt

    Original Paper 04 May 2006 Pages: 83 - 86

13. Electron Excited L X-Ray Spectra of the Elements 24 ≤ Z ≤ 33

    • Andrea Aßmann
    • Jan Dellith
    • Michael Wendt

    Original Paper 04 May 2006 Pages: 87 - 89

14. Microanalysis of Hydrogen, Boron and Fluorine in Vesuvianite by Means of SIMS, EPMA and FTIR

    • Fabio Bellatreccia
    • Luisa Ottolini
    • Giancarlo Della Ventura

    Original Paper 18 April 2006 Pages: 91 - 94

15. Assessment of Inorganic Fibre Burden in Biological Samples by Scanning Electron Microscopy – Energy Dispersive Spectroscopy

    • Elena Belluso
    • Donata Bellis
    • Sergio Coverlizza

    Original Paper 15 May 2006 Pages: 95 - 100

16. Laboratory Microbeam Analysis Applied to Cultural Heritage Studies

    • Dario Benedetti
    • Ivano Alessandri
    • Laura E. Depero

    Original Paper 15 May 2006 Pages: 101 - 104

17. Yttrium Geothermometry Applied to Garnets from Different Metamorphic Grades Analysed by EPMA and µ-PIXE Techniques

    • Alessandro Borghi
    • Roberto Compagnoni
    • Gloria Vaggelli

    Original Paper 28 April 2006 Pages: 105 - 112

18. Installation of a Shielded SIMS for the Analysis of Irradiated Nuclear Fuels

    • Stéphane Brémier
    • Rachid Hasnaoui
    • Clive T. Walker

    Original Paper 12 June 2006 Pages: 113 - 120

19. The Blue Pigment Used in Vallemaggia (Switzerland) in the Half of 19^th Century by Painters Vanoni and Pedrazzi

    • Giovanni Cavallo

    Original Paper 18 April 2006 Pages: 121 - 124

20. Accurate Determination of Trace Amounts of Oxygen in CrAlN Hard Coatings by a Combination of WDS–EPMA and SIMS

    • Sabine Dreer
    • Peter Wilhartitz
    • Karl Emanuel Mayerhofer

    Original Paper 15 May 2006 Pages: 125 - 128

21. EDX-Spectra Simulation in Electron Probe Microanalysis. Optimization of Excitation Conditions and Detection Limits

    • Frank Eggert

    Original Paper 04 May 2006 Pages: 129 - 136

22. WDXRF, EPMA and SEM/EDX Quantitative Chemical Analyses of Small Glass Samples

    • Roberto Falcone
    • Giuseppe Sommariva
    • Marco Verità

    Original Paper 04 May 2006 Pages: 137 - 140

23. The Valence State Analysis of Ti in FeTiO₃ by Soft X-Ray Spectroscopy

    • Sei Fukushima
    • Takashi Kimura
    • Michiru Yamashita

    Original Paper 18 April 2006 Pages: 141 - 145

24. Microanalysis of Glass Surfaces after Thermal Exposure

    • Ondrej Gedeon
    • Karel Jurek

    Original Paper 15 May 2006 Pages: 147 - 150

25. Advanced X-Ray Laboratory Microbeam Techniques Applied to Metallurgy

    • Marcello Gelfi
    • Elza Bontempi
    • Laura E. Depero

    Original Paper 15 May 2006 Pages: 151 - 155

26. Low Voltage Contrast with an SEM Transmission Electron Detector

    • François Grillon

    Original Paper 18 April 2006 Pages: 157 - 161

27. Van Gogh’s Painting Grounds: Quantitative Determination of Bulking Agents (Extenders) Using SEM/EDX

    • Ralph Haswell
    • Leslie Carlyle
    • Kees T. J. Mensch

    Original Paper 11 May 2006 Pages: 163 - 167

28. Micro Analysis on Hallstatt Textiles: Colour and Condition

    • Ineke Joosten
    • Maarten R. van Bommel
    • Hans Reschreiter

    Original Paper 15 May 2006 Pages: 169 - 174

29. Spatial Resolution of a Wavelength-Dispersive Electron Probe Microanalyzer Equipped with a Thermal Field Emission Gun

    • Takashi Kimura
    • Kenji Nishida
    • Shigeo Tanuma

    Original Paper 04 May 2006 Pages: 175 - 178

30. EPMA Investigation of Roman Coin Silvering Techniques

    • Gunther Kraft
    • Stefan Flege
    • Wolfgang Ensinger

    Original Paper 08 May 2006 Pages: 179 - 182

31. Fission Gas Bubbles Characterisation in Irradiated UO₂ Fuel by SEM, EPMA and SIMS

    • Jérôme Lamontagne
    • Lionel Desgranges
    • Bertrand Pasquet

    Original Paper 18 April 2006 Pages: 183 - 187

32. Preparation of Reference Glasses for in-situ Analysis of Lithium and Boron

    • Brieuc Le Fevre
    • Luisa Ottolini

    Original Paper 26 May 2006 Pages: 189 - 194

33. Electron Probe Microanalysis of HfO₂ Thin Films on Conductive and Insulating Substrates

    • Marina Lulla
    • Jelena Asari
    • Väino Sammelselg

    Original Paper 28 April 2006 Pages: 195 - 198

34. Absolute Determination of Characteristic X-Ray Yields with a Wavelength-Dispersive Spectrometer

    • Claude Merlet
    • Xavier Llovet

    Original Paper 04 May 2006 Pages: 199 - 204

35. Influence of Second-Order Lines on the Quantitative Wavelength Dispersive Spectrometry Analysis at Low Accelerating Voltages

    • Valdek Mikli

    Original Paper 15 May 2006 Pages: 205 - 208

36. X-Ray Mapping and Interpretation of Scatter Diagrams

    • Ken Moran
    • Richard Wuhrer

    Original Paper 22 May 2006 Pages: 209 - 217

37. Shave-Off Depth Profiling for Nano-Devices

    • Masashi Nojima
    • Masayuki Toi
    • Yoshimasa Nihei

    Original Paper 28 April 2006 Pages: 219 - 223

38. Direct Visualization of Electromagnetic Microfields by Superposition of Two Kinds of Electron Holograms

    • Akinori Ohshita
    • Masaaki Okuhara
    • Kazuo Iida

    Original Paper 15 May 2006 Pages: 225 - 228

39. Strategies for Quantification of Light Elements in Minerals by SIMS: H, B and F

    • Luisa Ottolini
    • Fernando Cámara
    • Frank C. Hawthorne

    Original Paper 04 May 2006 Pages: 229 - 233

40. New Orientation Formation During Recrystallization of Cold Deformed, High Symmetry Aluminium Bicrystals

    • Henryk Paul
    • Julian Driver

    Original Paper 22 May 2006 Pages: 235 - 242

41. Orientation Imaging in Scanning Electron and Transmission Electron Microscopy for Characterization of the Shear Banding Phenomenon

    • Henryk Paul
    • Adam Morawiec
    • Andrzej Piątkowski

    Original Paper 22 May 2006 Pages: 243 - 250

42. Light-Lithophile Element Metasomatism of Finero Peridotite (W ALPS): A Secondary-Ion Mass Spectrometry Study

    • Nicola Raffone
    • Brieuc Le Fèvre
    • Alberto Zanetti

    Original Paper 15 May 2006 Pages: 251 - 255

43. A New Method to Examine Interfacial Reactions of a Multilayered System NiAl–Hf–hBN on a Sapphire Fibre

    • Silvia Richter
    • Stepan Kyrsta
    • Joachim Mayer

    Original Paper 15 May 2006 Pages: 257 - 262

44. External Micro-PIXE Measurements: Preliminary Results on Volcanic Rocks from Nyiragongo Volcano

    • Alba P. Santo
    • Mariaelena Fedi
    • Francesco Taccetti

    Original Paper 15 May 2006 Pages: 263 - 267

45. The L Spectrum of Fe and Fe₃O₄

    • Andy Scheffel
    • Andrea Aßmann
    • Michael Wendt

    Original Paper 04 May 2006 Pages: 269 - 274

46. Detector Calibration and Measurement of Fundamental Parameters for X-Ray Spectrometry

    • Frank Scholze
    • Burkhard Beckhoff
    • Gerhard Ulm

    Original Paper 04 May 2006 Pages: 275 - 278

47. Comparison of 3D Surface Reconstruction Data from Certified Depth Standards Obtained by SEM and an Infinite Focus Measurement Machine (IFM)

    • Hartmuth Schroettner
    • Mario Schmied
    • Stefan Scherer

    Original Paper 28 April 2006 Pages: 279 - 284

48. Electrically Cooled SiLi Detectors for Application in X-Ray Equipment

    • Alexander Sokolov
    • Alexander Pchelintsev
    • Vladimir Gostilo

    Original Paper 15 May 2006 Pages: 285 - 288

49. Pile-Up Correction for Improved Accuracy and Speed of X-Ray Analysis

    • Peter J. Statham

    Original Paper 28 April 2006 Pages: 289 - 294

50. A New Method of Surface Preparation for High Spatial Resolution EPMA/SEM with an Argon Ion Beam

    • Hideyuki Takahashi
    • Ayako Sato
    • John Critchell

    Original Paper 31 May 2006 Pages: 295 - 300