MAPAN - Upcoming Special Issue on Measurement and Metrology in Advanced Manufacturing Processes
Submission deadline: January, 2022
Guest Editors:
Dr. Kaushal A Desai
Department of Mechanical Engineering, Indian Institute of Technology Jodhpur Karwad, Jodhpur, Rajasthan, India.
Dr. Gaurav Ameta
Senior Key Expert, Siemens Technology, Princeton, NJ, USA.
Dr. Ms. Girija Moona
Senior Scientist- Length, Dimension and Nano Metrology, Room Number 18, Apex Metrology Laboratory, CSIR-National Physical Laboratory, Dr. K. S. Krishnan Marg, New Delhi.
Dr Pavan Kumar Kankar
Associate Professor, Department of Mechanical Engineering, Indian Institute of Technology Indore, India