Volume 76, Issue 9, September 2012

ISSN: 1062-8738 (Print) 1934-9432 (Online)

In this issue (25 articles)

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  1. No Access

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics

    Reconstructing the energy spectra of backscattered electrons with allowance for the spectrometer’s response function

    N. A. Koshev, N. A. Orlikovskii, E. I. Rau… Pages 959-964
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    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics

    Automating the mode of the electron-probe control of templates for imprint lithography

    V. V. Kazmiruk, T. N. Savitskaya Pages 965-969
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    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics

    Experimental cathodoluminescence studies of exciton transport in gallium nitride

    A. N. Polyakov, M. Noltemeyer, T. Hempel… Pages 970-973
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    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics

    Allowing for matrix effects in local electron-probe analysis using a new model of the distribution function for the depth of characteristic X-ray radiation

    N. N. Mikheev, M. A. Stepovich… Pages 974-977
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    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics

    Prospects for using cathodoluminescence in SEM to study the distribution and types of breakdown in glass insulators

    A. V. Kuz’menkov, P. V. Ivannikov… Pages 978-982
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    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics

    Precision depth profiling of nanoelectronic structures using secondary molecular ions in secondary-ion mass spectrometry

    A. N. Pustovit, A. F. Vyatkin Pages 983-986
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    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics

    Analyzing SEM collection efficiency

    O. D. Potapkin, A. A. Melnikov Pages 987-990
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    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics

    Electron beam lithography with a Gaussian current distribution for nanolithography

    O. D. Potapkin Pages 991-994
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  9. No Access

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics

    Investigating the optical properties of a near-surface layer in silicon implanted by zinc after thermal annealing

    V. V. Privezentsev, M. V. Chukichev… Pages 995-998
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  10. No Access

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics

    Electron tomography and morphological analysis of the structure of multicomponent amorphous and nanocrystalline alloys

    O. V. Voitenko, E. B. Modin, I. S. Smirnov… Pages 999-1001
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  11. No Access

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics

    Investigation of silicon-on-sapphire structures by means of TEM

    D. A. Pavlov, P. A. Shilyaev, E. V. Korotkov… Pages 1002-1004
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  12. No Access

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics

    Studying the structure of nanocomposites obtained via the chemical decomposition of metal siloxanes in polymer matrices

    B. G. Zavin, N. V. Cherkun, N. V. Sergienko… Pages 1005-1008
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  13. No Access

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics

    Determining the young modulus of nanosize thickness coatings for MEMS from the results of static force spectroscopy

    S. O. Abetkovskaya, S. A. Chizhik… Pages 1009-1011
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  14. No Access

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics

    In-situ investigation of the structure of electrolitically deposited cobalt-phosporous alloy upon heating

    E. B. Modin, O. V. Voitenko, A. P. Glukhov… Pages 1012-1014
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    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics

    Eliminating distortions of nonperiodic structures in images

    B. N. Grudin, S. V. Dolzhikov… Pages 1015-1019
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    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics

    Simulation and analysis of images using spectral characteristics

    B. N. Grudin, V. S. Plotnikov… Pages 1020-1024
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    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics

    Characterizing the structure of Co/Cu and NiFe/Cu multilayered magnetic nanowires

    E. B. Modin, O. V. Voitenko, I. S. Smirnov… Pages 1025-1026
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  18. No Access

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics

    Effect of electron irradiation on fluorides of alkali-earth elements (CaF2, SrF2 and BaF2)

    V. I. Nikolaichik, B. P. Sobolev… Pages 1027-1031
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  19. No Access

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics

    Cationic nonstoichiometry of oxides of the Ba-Cu-O and Y-Ba-Cu-O systems

    V. I. Nikolaichik, L. A. Klinkova… Pages 1032-1035
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  20. No Access

    Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation Applied for Solid States Physics

    Growth and properties of GaAs and GaN films and low-dimensional GaAs/QWsInGaAs structures on Si substrates with a Ge buffer layer

    Yu. N. Buzynin, V. G. Shengurov… Pages 1036-1040
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