1. Characterization of flaws using the zeroes of the real and imaginary parts of the ultrasonic scattering amplitude

   • Vladimir G. Kogan
   • David K. Hsu
   • James H. Rose

   OriginalPaper Pages: 57 - 68

2. A new acoustic spectroscopy: Resonance spectroscopy by the MIIR

   • Jean Ripoche
   • Gérard Maze
   • Jean-Louis Izbicki

   OriginalPaper Pages: 69 - 79

3. Surface electromagnetic fields around surface flaws in metals

   • R. Collins
   • D. H. Michael
   • H. G. Pinsent

   OriginalPaper Pages: 81 - 93

4. Two-dimensional inverse born approximation in ultrasonic flaw characterization

   • K. C. Tam

   OriginalPaper Pages: 95 - 106