1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 30 November 2012 Pages: 773 - 774

   

2. Test Technology Newsletter

   News 16 November 2012 Pages: 775 - 776

   

3. Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach

   • M. Portela-Garcia
   • A. Lindoso
   • F. Vargas

   OriginalPaper 24 August 2012 Pages: 777 - 789

   

4. Prediction of Long-term Immunity of a Phase-Locked Loop

   • A. Boyer
   • S. Ben Dhia
   • B. Vrignon

   OriginalPaper 30 November 2012 Pages: 791 - 802

   

5. A Test Platform for Dependability Analysis of SoCs Exposed to EMI and Radiation

   • Juliano Benfica
   • Letícia Maria Bolzani Poehls
   • Fernando Hernandez

   OriginalPaper 14 November 2012 Pages: 803 - 816

   

6. K^th-Aggressor Fault (KAF)-based Thru-Silicon-Via Interconnect Built-In Self-Test and Diagnosis

   • Vladimir Pasca
   • Lorena Anghel
   • Mounir Benabdenbi

   OriginalPaper 04 August 2012 Pages: 817 - 829

   

7. Structural Test and Diagnosis for Graceful Degradation of NoC Switches

   • Atefe Dalirsani
   • Stefan Holst
   • Hans-Joachim Wunderlich

   OriginalPaper 05 October 2012 Pages: 831 - 841

   

8. A Non-Enumerative Technique for Measuring Path Correlation in Digital Circuits

   • Stelios N. Neophytou
   • Kyriakos Christou
   • Maria K. Michael

   OriginalPaper 19 October 2012 Pages: 843 - 856

   

9. Current State of the Mixed-Signal Test Bus 1149.4

   • Jari Hannu
   • Juha Häkkinen
   • Markku Moilanen

   OriginalPaper 17 November 2012 Pages: 857 - 863

   

10. Current Consumption and Power Integrity of CMOS Digital Circuits Under NBTI Wearout

    • J. M. Ruiz
    • R. Fernández-Garcia
    • M. Morata

    OriginalPaper 14 November 2012 Pages: 865 - 868

    

11. Data-Driven DPPM Estimation and Adaptive Fault Coverage Calibration Using MATLAB^®

    • Kanad Chakraborty
    • Vishwani D. Agrawal

    Letter 09 October 2012 Pages: 869 - 875

    

12. Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter

    • Y. Ren
    • L. Fan
    • B. L. Bhuva

    OriginalPaper 16 November 2012 Pages: 877 - 883