Volume 28, Issue 6, December 2012

ISSN: 0923-8174 (Print) 1573-0727 (Online)

In this issue (12 articles)

  1. EditorialNotes

    Editorial

    Vishwani D. Agrawal Pages 773-774
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    News

    Test Technology Newsletter

    Pages 775-776
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    OriginalPaper

    Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach

    M. Portela-Garcia, A. Lindoso, L. Entrena… Pages 777-789
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    OriginalPaper

    Prediction of Long-term Immunity of a Phase-Locked Loop

    A. Boyer, S. Ben Dhia, B. Li, C. Lemoine, B. Vrignon Pages 791-802
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    OriginalPaper

    A Test Platform for Dependability Analysis of SoCs Exposed to EMI and Radiation

    Juliano Benfica, Letícia Maria Bolzani Poehls… Pages 803-816
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    OriginalPaper

    Kth-Aggressor Fault (KAF)-based Thru-Silicon-Via Interconnect Built-In Self-Test and Diagnosis

    Vladimir Pasca, Lorena Anghel, Mounir Benabdenbi Pages 817-829
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    OriginalPaper

    Structural Test and Diagnosis for Graceful Degradation of NoC Switches

    Atefe Dalirsani, Stefan Holst, Melanie Elm… Pages 831-841
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    OriginalPaper

    A Non-Enumerative Technique for Measuring Path Correlation in Digital Circuits

    Stelios N. Neophytou, Kyriakos Christou, Maria K. Michael Pages 843-856
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    OriginalPaper

    Current State of the Mixed-Signal Test Bus 1149.4

    Jari Hannu, Juha Häkkinen, Juha-Veikko Voutilainen… Pages 857-863
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    OriginalPaper

    Current Consumption and Power Integrity of CMOS Digital Circuits Under NBTI Wearout

    J. M. Ruiz, R. Fernández-Garcia, I. Gil, M. Morata Pages 865-868
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    Letter

    Data-Driven DPPM Estimation and Adaptive Fault Coverage Calibration Using MATLAB®

    Kanad Chakraborty, Vishwani D. Agrawal Pages 869-875
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    OriginalPaper

    Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter

    Y. Ren, L. Fan, L. Chen, S.-J. Wen, R. Wong… Pages 877-883
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