Volume 28, Issue 5

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October 2012

Special Issue on Analog, Mixed-Signal, RF, and MEMS Testing

Issue Editors:

Hsiu-Ming Chang,
DAVID KEEZER

19 articles in this issue

Editorial
Vishwani D. Agrawal
EditorialNotes 13 September 2012 Pages: 551 - 552
Test Technology Newsletter

News 24 August 2012 Pages: 553 - 554
Guest Editorial: Special Issue on Analog, Mixed-Signal, RF, and MEMS Testing
Hsiu-Ming (Sherman) Chang
David C. Keezer
EditorialNotes 12 September 2012 Pages: 555 - 556
Built-in Self Test of RF Subsystems with Integrated Detectors
Chaoming Zhang
Ranjit Gharpurey
Jacob A. Abraham
OriginalPaper 14 July 2012 Pages: 557 - 569
Experimental Results of Testing a BIST Σ–Δ ADC on the HOY Wireless Test Platform
Shao-Feng Hung
Hao-Chiao Hong
OriginalPaper 09 May 2012 Pages: 571 - 584
A Built-in Self-Test Scheme for Memory Interfaces Timing Test and Measurement
Hyun Jin Kim
Jacob A. Abraham
OriginalPaper 07 September 2012 Pages: 585 - 597
FPGA-based Novel Adaptive Scheme Using PN Sequences for Self-Calibration and Self-Testing of MEMS-based Inertial Sensors
Elie H. Sarraf
Ankit Kansal
Edmond Cretu
OriginalPaper 01 November 2012 Pages: 599 - 614
On Chip Signal Generators for Low Overhead ADC BIST
Jingbo Duan
Bharath Vasan
Randall Geiger
OriginalPaper 29 July 2012 Pages: 615 - 623
High Speed On-Chip Signal Generation for Debug and Diagnosis
Tsung-Yen Tsai
Sadok Aouini
Gordon Walter Roberts
OriginalPaper Open access 01 April 2012 Pages: 625 - 640
Low-Distortion Sinewave Generation Method Using Arbitrary Waveform Generator
Kazuyuki Wakabayashi
Keisuke Kato
Kiichi Niitsu
OriginalPaper 01 April 2012 Pages: 641 - 651
Time-Based Embedded Test Instrument with Concurrent Voltage Measurement Capability
Kemal Kulovic
Martin Margala
OriginalPaper 25 May 2012 Pages: 653 - 671
Novel Practical Built-in Current Sensors
Samed Maltabas
Kemal Kulovic
Martin Margala
OriginalPaper 21 July 2012 Pages: 673 - 683
On the Use of Static Temperature Measurements as Process Variation Observable
Didac Gómez
Josep Altet
Diego Mateo
OriginalPaper 16 May 2012 Pages: 685 - 695
Calibration Enabled Scalable Current Sensor Module for Quiescent Current Testing
Sachin Dileep Dasnurkar
Jacob A. Abraham
OriginalPaper 05 October 2012 Pages: 697 - 704
An MCT-Based Bit-Weight Extraction Technique for Embedded SAR ADC Testing and Calibration
Xuan-Lun Huang
Jiun-Lang Huang
Ding-Ming Kwai
OriginalPaper 23 August 2012 Pages: 705 - 722
Maximizing Parallel Testing in an FM Receiver
Mozar Naing
Dallas Webster
Donald Y. C. Lie
OriginalPaper 12 August 2012 Pages: 723 - 731
An Accurate and Cost-Effective Jitter Measurement Technique Using a Single Test Frequency
Minshun Wu
Degang Chen
Jingbo Duan
OriginalPaper 01 July 2012 Pages: 733 - 743
Feature Vector Selection Method Using Mahalanobis Distance for Diagnostics of Analog Circuits Based on LS-SVM
Bing Long
Shulin Tian
Houjun Wang
OriginalPaper 08 May 2012 Pages: 745 - 755
Parametric Fault Testing of Non-Linear Analog Circuits Based on Polynomial and V-Transform Coefficients
Suraj Sindia
Vishwani D. Agrawal
Virendra Singh
OriginalPaper 28 August 2012 Pages: 757 - 771

Volume 28, Issue 5

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