1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 28 May 2011 Pages: 219 - 219

2. Test Technology Newsletter

   News 31 May 2011 Pages: 221 - 222

   

3. Guest Editorial

   • H.-G. Stratigopoulos
   • K. Chakrabarty

   EditorialNotes 01 June 2011 Pages: 223 - 223

4. Survey of Robustness Enhancement Techniques for Wireless Systems-on-a-Chip and Study of Temperature as Observable for Process Variations

   • Marvin Onabajo
   • Didac Gómez
   • Jose Silva-Martinez

   OriginalPaper 09 February 2011 Pages: 225 - 240

   

5. Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme

   • Sukeshwar Kannan
   • Bruce Kim
   • Craig Force

   OriginalPaper 24 March 2011 Pages: 241 - 252

   

6. Methodology to Replace Sensitivity BER and Transmit Power Production Tests in Bluetooth Devices with BiSTs

   • Deepa Mannath
   • David Cohen
   • Simon S. Ang

   OriginalPaper 09 April 2011 Pages: 253 - 266

   

7. RFID System On-line Testing Based on the Evaluation of the Tags Read-Error-Rate

   • Gilles Fritz
   • Vincent Beroulle
   • David Hély

   OriginalPaper 29 December 2010 Pages: 267 - 276

   

8. Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope Signatures

   • Manuel J. Barragán
   • Rafaella Fiorelli
   • José L. Huertas

   OriginalPaper 06 January 2011 Pages: 277 - 288

   

9. A Level-Crossing Approach for the Analysis of RF Modulated Signals Using Only Digital Test Resources

   • Nicolas Pous
   • Florence Azaïs
   • Jochen Rivoir

   OriginalPaper 08 April 2011 Pages: 289 - 303

   

10. Analog Sinewave Signal Generators for Mixed-Signal Built-in Test Applications

    • Manuel J. Barragán
    • Diego Vázquez
    • Adoración Rueda

    OriginalPaper 08 January 2011 Pages: 305 - 320

    

11. Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model

    • Joonsung Park
    • Hongjoong Shin
    • Jacob A. Abraham

    OriginalPaper 31 May 2011 Pages: 321 - 334

    

12. Digital Test Method for Embedded Converters with Unknown-Phase Harmonics

    • Vincent Kerzérho
    • Mariane Comte
    • Michel Renovell

    OriginalPaper 08 February 2011 Pages: 335 - 350

    

13. Extending a DWDM Optical Network Test System to 12 Gbps x4 Channels

    • Carl Edward Gray
    • David C. Keezer

    OriginalPaper 09 April 2011 Pages: 351 - 361

    

14. Assessment of Microfluidic System Testability using Fault Simulation and Test Metrics

    • Thomas O. Myers
    • Ian M. Bell

    OriginalPaper 22 February 2011 Pages: 363 - 373

    

15. An Oscillation-Based Technique for Degradation Monitoring of Sensing and Actuation Electrodes Within Microfluidic Systems

    • Qais Al-Gayem
    • Andrew Richardson
    • Nick Burd

    OriginalPaper 18 February 2011 Pages: 375 - 387

    

16. A Parallel Tester Architecture for Accelerometer and Gyroscope MEMS Calibration and Test

    • Lyl M. Ciganda Brasca
    • Paolo Bernardi
    • Maurizio Straiotto

    OriginalPaper 11 March 2011 Pages: 389 - 402

    

17. Tungsten Lamps as an Affordable Light Source for Testing of Photovoltaic Cells

    • Jeydmer Aristizabal
    • Badr Omrane
    • Carlo Menon

    OriginalPaper 24 May 2011 Pages: 403 - 410

    

18. A Behavioral Model of MEMS Convective Accelerometers for the Evaluation of Design and Calibration Strategies at System Level

    • Ahmed Amine Rekik
    • Florence Azaïs
    • Pascal Nouet

    OriginalPaper 11 March 2011 Pages: 411 - 423