1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 06 January 2010 Pages: 1 - 2

   

2. Test Technology Newsletter

   News 12 January 2010 Pages: 3 - 4

   

3. Guest Editorial

   • Karim Arabi

   EditorialNotes 22 December 2009 Pages: 5 - 5

4. General Design for Test Guidelines for RF IC

   • Qi Fan

   OriginalPaper 19 December 2009 Pages: 7 - 12

   

5. Low-Cost Specification Based Testing of RF Amplifier Circuits using Oscillation Principles

   • Abhilash Goyal
   • Madhavan Swaminathan
   • Abhijit Chatterjee

   OriginalPaper 02 March 2010 Pages: 13 - 24

   

6. Estimation of RF PA Nonlinearities after Cross-correlating Current and Output Voltage

   • Pedro Fonseca Mota
   • José A. Machado da Silva
   • Ricardo A. Veiga

   OriginalPaper 12 January 2010 Pages: 25 - 35

   

7. Fault Coverage Analysis of Peak-Detector Based BIST for RF LNAs

   • R. M. Ayadi
   • M. Masmoudi

   OriginalPaper 19 January 2010 Pages: 37 - 45

   

8. ADC Non-Linearity Low-Cost Test Through a Simplified Double-Histogram Method

   • M. A. Jalón
   • E. Peralías

   OriginalPaper 26 January 2010 Pages: 47 - 58

   

9. Calibration and Test Time Reduction Techniques for Digitally-Calibrated Designs: an ADC Case Study

   • Hsiu-Ming Sherman Chang
   • Kuan-Yu Lin
   • Kwang-Ting Tim Cheng

   OriginalPaper 06 January 2010 Pages: 59 - 71

   

10. Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits

    • Hongjoong Shin
    • Joonsung Park
    • Jacob A. Abraham

    OriginalPaper 06 January 2010 Pages: 73 - 86

    

11. Low-Cost 20 Gbps Digital Test Signal Synthesis Using SiGe and InP Logic

    • David Keezer
    • Carl Gray
    • Patrice Ducharme

    OriginalPaper 15 January 2010 Pages: 87 - 96

    

12. Using Stochastic Differential Equation for Verification of Noise in Analog/RF Circuits

    • Rajeev Narayanan
    • Mohamed H. Zaki
    • Sofiène Tahar

    OriginalPaper 07 January 2010 Pages: 97 - 109

    

13. Study of an Electrical Setup for Capacitive MEMS Accelerometers Test and Calibration

    • Norbert Dumas
    • Florence Azaïs
    • Pascal Nouet

    OriginalPaper 22 December 2009 Pages: 111 - 125

    

14. Testing Multilayer Flexible Wireless Multisensor Platforms

    • Yindar Chuo
    • Bozena Kaminska

    OriginalPaper 19 December 2009 Pages: 127 - 138

    

15. Applications for Low Frequency Impedance Analysis Systems

    • Matthew Giassa
    • Ajit Khosla
    • Ramani Ramaseshan

    OriginalPaper 15 December 2009 Pages: 139 - 144