1. Editorial

   EditorialNotes Pages: 5 - 5

2. Guest editorial

   EditorialNotes Pages: 7 - 7

3. New editorial board members

   EditorialNotes Pages: 9 - 9

4. List of reviewers

   Legacy Pages: 10 - 10

5. IEEE standard 1149.1-1990 on boundary scan: History, literature survey, and current status

   • R. G. Bennetts
   • A. Osseyran

   OriginalPaper Pages: 11 - 25

6. An introduction to the boundary scan standard: ANSI/IEEE Std 1149.1

   • C. M. Maunder
   • R. E. Tulloss

   OriginalPaper Pages: 27 - 42

7. A language for describing boundary scan devices

   • Kenneth P. Parker
   • Stig Oresjo

   OriginalPaper Pages: 43 - 75

8. Boundary scan test, test methodology, and fault modeling

   • Frans De Jong
   • José S. Matos
   • José M. Ferreira

   OriginalPaper Pages: 77 - 88

9. ATPG and diagnostics for boards implementing boundary scan

   • Don Sterba
   • Andy Halliday
   • Don McClean

   OriginalPaper Pages: 89 - 98

10. Scan test architectures for digital board testers

    • Matthew L. Fichtenbaum
    • Gordon D. Robinson

    OriginalPaper Pages: 99 - 105

11. Features of a Scan and Clock Resource chip for providing access to board-level test functions

    • Bulent I. Dervisoglu

    OriginalPaper Pages: 107 - 115

12. An optimal scheduling algorithm for testing interconnect using boundary scan

    • Jung-Cheun Lien
    • Melvin A. Breuer

    OriginalPaper Pages: 117 - 130