Volume 74, Issue 1, January 2013

ISSN: 0005-1179 (Print) 1608-3032 (Online)

In this issue (15 articles)

  1. No Access

    Safety, Viability, Reliability, Technical Diagnostics

    On t-diagnosability of multicore systems with symmetric circulant structure

    Yu. K. Dimitriev Pages 105-112
  2. No Access

    Safety, Viability, Reliability, Technical Diagnostics

    Project verification and construction of superchip tests at the RTL level

    L. A. Zolotorevich Pages 113-122